首页 | 本学科首页   官方微博 | 高级检索  
     检索      

星上FPGA抗闩锁设计
引用本文:杨雅,廖瑛,盖建宁,施敏华.星上FPGA抗闩锁设计[J].上海航天,2005,22(6):51-54.
作者姓名:杨雅  廖瑛  盖建宁  施敏华
作者单位:1. 国防科学技术大学,航天与材料工程学院,湖南,长沙,410073;上海航天计算机研究所,上海,200050
2. 国防科学技术大学,航天与材料工程学院,湖南,长沙,410073
3. 上海航天计算机研究所,上海,200050
摘    要:根据星载电子设备CMOS电路中现场可编程逻辑阵列(FPGA)闩锁的发生机理,提出了输入/输出回路的抗锁定、二次屏蔽防止单粒子触发锁定等遏制闩锁触发条件,以及工作电源限流、闩锁检测与解除等遏制闩锁维持条件的设计,并给出了应用检测电路、板级锁定检测与解除、电流敏感器件检测电流和FPGA闩锁监测等应用实例。

关 键 词:星载电子设备  现场可编程逻辑阵列  抗闩锁  设计  可靠性
文章编号:1006-1630(2005)06-0051-04
收稿时间:2005-05-30
修稿时间:2005-07-22

Anti-Latch-Up Design of On-Board FPGA
YANG Ya,LIAO Ying,GAI Jian-ning,SHI Min-hua.Anti-Latch-Up Design of On-Board FPGA[J].Aerospace Shanghai,2005,22(6):51-54.
Authors:YANG Ya  LIAO Ying  GAI Jian-ning  SHI Min-hua
Institution:1. College of Aerospace and Material Engineering, NUDT, Changsha Hunan 410073, China; 2. Shanghai Aerospace Computer and Technology Institute, Shanghai 200050, China
Abstract:According to the latch-up mechanism of field programmable gate array(FPGA) in CMOS circuit for on-board electronics,the designs for anti-latch-up triggering conditions such as anti-latch-up in input/output circuit and secondary shielding to prevent single event,anti-latch-up maintenance such as operation current limitation and latch-up detection and release were put forward in this paper.The application examples of employed test circuit,board latch-up detection and release,current detection by current sensor and FPGA latch-up monitoring were also given.
Keywords:On-board embedded computer  Field programmable gate array  Anti-latch-up  Design  Reliability
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号