首页 | 本学科首页   官方微博 | 高级检索  
     检索      

功率MOSFET测试仪的设计
引用本文:张建芳,刘连生.功率MOSFET测试仪的设计[J].中国民航学院学报,2009,27(1):51-54.
作者姓名:张建芳  刘连生
作者单位:中国民航大学基础实验中心,天津,300300  
基金项目:中国民用航空局科技项目 
摘    要:介绍了以单片机为核心的功率MOSFET测试仪的原理、系统结构及具体的软硬件设计。将脉冲功率法引入功率MOSFET跨导和沟道电阻的测试,很好地解决了大电流偏置下参数测试的散热问题。所设计的功率MOSFET测试仪可以进行功率MOSFET的耐压、沟道电阻、开启电压、跨导及输入结电容几个参数的精确测量,并已实用化。

关 键 词:单片机  脉冲功率法  MOSFET  测试仪

Design of Test Apparatus of Power MOSFET
ZHANG Jian-fang,LIU Lian-sheng.Design of Test Apparatus of Power MOSFET[J].Journal of Civil Aviation University of China,2009,27(1):51-54.
Authors:ZHANG Jian-fang  LIU Lian-sheng
Institution:(Basic Experiment Center, CA UC, Tianjin 300300, China)
Abstract:In this paper, the principle, system stucture and the design of both hardware and software of a kind of power MOSFET the meaning of the test apparatus are introduced, which is based upon MCU. The pulse power method is applied in the forward transconductance and static drain-source on resistance testing of power MOSFET, which could solve the overheat problem of parameters testing under great bias current well. This test apparatus is able to measure the drain-source breakdown voltage, static drain-source on resistance, gate threshold voltage, forward transconductance and input capacitance of power MOSFET accurately, which has been applied in practice.
Keywords:MOSFET
本文献已被 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号