通过纯软件的方法测试数字处理器的故障敏感性

对于工作在高辐射太空中的飞行器而言，它不可避免会受到单粒子效应的影响。因此，如何预测飞行器中单粒子效应敏感区域以便加强保护措施是一件很重要的工作。但事实上，要预测单粒子效应对飞行器的影响并不容易。本文给出了一种通过纯软件来评测飞行器系统对单粒子效应的敏感程度的方法——软件故障注入法——这也是评测微电子电路可靠性极具前景的方法。该方法采用高效的汇编语言在汇编级实现，对目标系统不会造成损伤，并且使用方便。试验的结果表明，目标处理器对于单粒子翻转的敏感性大约为1．38％到2．35％，且寄存器的敏感性要高于内存区。

Test Fault Sensitivity of a Digital Processor by a Pure Software Approach

As an instrument working in the space, aircraft are much easy affected by single Events Effects. So to find the most easily affected area and protect them more carefully from radiation is very important. However, to predict the effects of Single Events Effects on aircraft is not an easy thing. In Ibis paper, the faull sensitivity of some aircraft is tested by a software approach, software fault injection, which is one of the most promising test methods to evaluate lhe reliability of microclectronic circuit. The approach was implemented at assembly level with high efficiency assembly language, which had no effect on the target system and was very convenient. Results obtained show that fanh sensitivity of the target processor is about 1. 385 to 2.35 %, and registers are more sensitive to faults than memory area do.