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As a circuit is tested, the current drawn from a power supply can vary as different functions are invoked by the test. The current draw can be plotted against time, showing a characteristic trace for the test performed. Sensors in the ATS power supply can be used to monitor the current flow during test execution. Defective components can be classified using a Neural Network according to the pattern of variation from the “trace” of a good card. This can be performed as a background function, with the network gaining in accuracy over time. This paper discusses the Neural Network Routine for diagnosing circuit faults using monitored power supply current 相似文献
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