Automated testing

Since the DoD was the leader in incorporating transistors, ICs and embedded processors, they also were on the forefront in developing automatic test equipment. The term automatic test equipment (ATE) encompasses all phases of computer controlled testing. It is based on the integration of instruments, computers and software. These systems generally include five basic elements: control, stimulus, measurement, switching and software. A special interface device or interface test adapter connects the unit under test (UUT) to the ATE. Test program software connects the ATE to the appropriate UUT test points, programs the input stimulus and monitors the output response     

Successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility

In today's world of constrained budgets, one of the problems the military faces is the challenge of trying to maintain organic maintenance capabilities. Historically, the US Air Force has desired to achieve an autonomous capability to maintain the equipment it uses. This has been achieved, traditionally, by setting-up three levels of maintenance: organizational; intermediate (back-shop); and depot. The I-level back-shops often utilize militarized automatic test equipment (ATE) and test program sets (TPSs) to test today's complex aircraft line replaceable units (LRUs). And even though this is still a cost-effective maintenance philosophy, it has become costly to develop militarized ATE. The Department of Defense (DoD) has been very active in trying to reduce the total ownership cost of ATE in the government inventory. One approach is to utilize commercial, instead of Mil-Spec, ATE. However, utilizing commercial ATE at an USAF back-shop is not without its tradeoffs and challenges as it represents a significant deviation from the way the USAF maintenance squadrons are accustomed to "doing business." This paper documents the current success story of replacing the legacy C-17 I-level ATE with a commercial ATE.     

Implementing reusable, instrument independent test programs in thefactory

Development of computer programs that control test sequences on Automatic Test Equipment (ATE) is costly and time consuming. Test Programs are usually written by specifying the instruments to be used in the ATE and the sequence of the setup and measurement parameters for these instruments. Reuse of test program software on other ATE is usually not possible without rewriting, revalidating and re-releasing the programs. This paper describes an implementation of a test program software development system and a standard of software runtime architecture used in our factories. The object-oriented development environment and its associated class libraries allow test programs to be written without knowledge of the ATE on which they will be run. Two main principles guided the design: the software architecture was based on recognized formal and industry standards; and our implementation used commercial off-the-shelf software products when possible. Emerging standards such as the IEEE-1226 (ABBET) as well as defacto industry standards including VXI Plug and Play have made our implementation possible. The current draft of the ABBET and P&P standards do not promote this instrument independence, but it is hoped that this will be added as the standards mature. Three immediate benefits are: cost savings that result from reusing validated test programs; cycle time reductions that result from concurrently developing test program software and ATE; and software defect reductions that result from using proven software     

Sustainment of legacy automatic test systems: lessons learned on TPS transportability

Sustainment of legacy automatic test systems (ATS) saves cost through the re-use of software and hardware. The ATS consists of the automatic test equipment (ATE), the test program sets (TPSs), and associated software. The associated software includes the architecture the TPSs run on, known as the control software or test station test executive. In some cases, to sustain the legacy ATS, it is more practical to develop a replacement ATE with the latest instrumentation, often in the form of commercial off-the-shelf (COTS) hardware and software. The existing TPSs, including their hardware and test programs, then need to be transported, or translated, to the new test station. In order to understand how to sustain a legacy ATS by translating TPSs, one must realize the full architecture of the legacy ATS to be replaced. It must be understood that TPS transportability does not only include translating the original TPS from an existing language (such as ATLAS) to a new language (such as "C") to run on a new test station, but includes transporting the run-time environment created by the legacy ATS. This paper examines the similarities and differences of legacy ATE and modern COTS ATE architectures, how the ATS testing philosophy impacts the ease of TPS transportability from legacy ATE to modern-day platforms, and what SEI has done to address the issues that arise out of TPS transportability.     

ATE综合校准系统的软件设计及实现

通用自动测试设备（ATE）的测量准确性、可靠性会直接影响飞机综合保障的质量,因此,对此检测设备进行全面有效的测试校准,是确保测试系统完成任务的关键。为了保障测试数据准确可靠和量值传递统一及实现现场的系统性校准工作,本课题以通用自动测试设备为对象,建立了一套基于虚拟仪器技术基础上的综合校准系统。本文对系统的软件结构设计进行了分析和设计,以LCOD原型生命周期为基础,使用了面对组件的设计模式,设计和实现了软件功能,使得该系统具有一定的兼容性和可移植性,并且为扩展留下了接口,同时保证了校准数据的可靠性和精确性。     

自动测试设备的效率方程

效率是各项指标的综合度量。首先提出度量自动测试设备(ATE)效率的8项技术指标:故障检测率FDR、故障隔离率FIR、检测准确度FDA、测试时间t_d、故障检测概率P_d、故障漏报概率P_m、虚警概率P_f和故障分辨率δ。重点是建立ATE的效率方程,包括建立和求解ATE的工作状态方程,导出故障检测效率方程,无模糊故障隔离的效率方程和模糊故障隔离的效率方程,即ATE的效率方程,从而为ATE指标的分析与综合提供一种理论依据。     

C-17 successful application of existing automatic test equipment

The C-17 Program utilizes existing B-1B Automatic Test Equipment (ATE). The C-17 decision is in harmony with the Air Force emphasis on reducing proliferation of unique ATE. The ATE selection was made after consideration of cost, performance and supportability tradeoffs. Minimal augmentation of the government inventoried equipment was required which did not affect the existing hardware and software configuration, This approach significantly reduced C-17 program ATE development costs and afforded the program the use of established logistics elements and support structure. The C-17 program demanded concurrency of support structure and aircraft development-the ATE solution met that demand by reducing risks to a manageable level for both test program set development, and Air Force operation and training requirements     

Role of BIT in support system maintenance and availability

The role of built in test (BIT) in electronic systems has grown in prominence with the advances in system complexity and concern over maintenance lifecycle costs of large systems. In an environment where standards drive system designs (and provide an avenue for focused advancement in technology), standards for BIT are very much in an evolutionary state. The reasons for advancing the effectiveness of BIT include reduced support overhead, greater, confidence in operation, and increased system availability. The cost of supporting military electronic systems (avionics, communications, and weapons systems) has driven much of the development in BIT technology. But what about the systems that support these end items that contain test and measurement instrumentation - such as automatic test equipment (ATE), simulators and avionics development suites? There has also been a beneficial effect on the maintenance and availability of these systems due to the infusion of BIT into their component assemblies. But the effect has been much more sporadic and fragmented. This paper looks at the state of BIT in test and measurement instruments, explain its affect on system readiness, and present ideas on how to improve BIT technologies and standards. This will not provide definitive answers to BIT development questions, since the factors that affect it are specific to the instrument itself. The topics covered in this paper are: definitions of built-in test, instrument BIT history, importance of BIT fault coverage and isolation in support systems, overview of BIT development process issues that limit the effectiveness of BIT Standards related to instrument BIT, making BIT more effective in support system maintenance and availability and conclusions.     

装备基本作战单元任务持续性度量参数研究

装备基本作战单元的任务持续能力是构成装备系统作战能力的要素,与装备系统的可靠性、维修性、保障性指标密切相关。为度量基本作战单元的任务持续能力,从系统工程思想出发,建立了装备基本作战单元的典型任务模型,据此对装备基本作战单元的任务持续性要求进行了分析,提出了装备基本作战单元的任务持续性参数,并对其选取原则和确定依据进行了研究,最后给出了使用试验过程中某型飞机基本作战单元任务持续性参数分析的示例。可以为装备研制、使用部门评估装备基本作战单元的任务持续能力,权衡装备可靠性、维修性、保障性与保障系统设计方案,进行装备使用试验提供理论支持。     

Generic training for ATE technicians

It is argued that the job of an automatic test equipment (ATE) technician is evolving toward that of a computer operator. The technician has automatic tools (test programs) written for every replaceable unit in his test set. The technician selects which test is run. During the test the technician is presented results and given options if a test fails. If the option called out by the test program does not fix the problem, the technician must go back into his tool box (his library of test programs) and select the right tool to do the job. This is true for a technician working on any piece of ATE. It is contended that training for these technicians should be centered around troubleshooting skills with initially less emphasis on the hardware implementation details. These skills could be developed with a genetic trainer     

装备保障建模仿真研究

为了评价作战单元的战备完好性、持续作战能力和保障能力,根据系统工程的建模仿真思想提出了装备保障建模研究的仿真概念模型,并以军用飞机为例对装备保障仿真试验进行了分析,包括任务、功能、维修过程和资源利用建模过程等。     

BIT和ATE组合测试技术及其应用

详细介绍了BIT和ATE组合测试技术及其在机载电子设备测试与故障诊断的具体应用。应用表明BIT和ATE组合测试技术可有效提高设备的测试性。     

便携式发动机参数模拟器的研制

利用PC104总线系统的特点,以某型航空发动机参数模拟器的研究为工程应用背景,解决适应现代测试技术特点的测试设备的研制问题。该模拟器具有抗恶劣环境、小型轻便、集成化程度高等优点,在实际应用的过程中取得了良好效果。     

自动测试系统通用性的实现技术

文章分析了与开发通用ATS密切相关的标准/规范,从软、硬件两方面讨论了ATS通用性的实现途径,包括硬件配置及接口技术、IVI技术以及面向信号方法。ATS通用性的实现可以实现被测对象的跨平台测试以及测试程序的可移植,能带来显著的军事及经济效益。     

Teaching old tricks to new dogs [automatic test equipment]

This describes why transferring test programs and fixtures from obsolete automatic test equipment (ATE) to new equipment are not as simple as it should be. No one would argue that technology has made major advances on test in the last 30 years. Today, speed, overall performance, computing power, and software tools are more sophisticated than 20 or 30 years ago, when the first ATE appeared. As these ATE now head for retirement and as the programs they support still have a long life to live, one would think legacy replacement with new ATE would be a simple task. Unfortunately, this is seldom the case. We realize that old ATE had a number of cards up their sleeves to deal with. For example, high voltage technology, lack of computer aided engineering (CAE) data, requirements for parametric tests, extensive usage of the guided probe, and many other aspects might be not so simple to be reproduced with modern, yet powerful, ATE. The paper shall identify the specific constraints involved with old technology and give examples of success stories where new ATE has been adapted to respond to the challenge. Paraphrasing (in reverse) and old saying, it is like "teaching old tricks to new dogs".     

Revolutionary ideas in test

This paper summarizes AUTOTESTCON 2001, focussing on the automatic test industry and their military/aerospace customers. Topics covered include: the state of the test industry; a history of ATE; fiber optic sensing and control technology for military aviation; thermal imaging for fault location; sensor fusion in diagnostics/prognostics; AI-based test solutions; and prognostic monitoring techniques     

Peripheral emulation extends equipment life [ATE]

The ATE industry can benefit greatly by becoming better informed about the availability, functionality, and reliability of emulated peripheral solutions. Emulated peripherals provide the ability to dramatically extend the life of aging ATE equipment, while making that equipment more reliable, more functional, much easier to use, and much simpler to support. The use of emulated disk drives and tape drives can completely eliminate persistent maintenance headaches, increase ATE station availability and reliability, and provide a reasonably priced technology refresh without costly software modifications or system recertification.     

Nanotechnology-based molecular test equipment (MTE)

This paper describes original research efforts in the design, simulation, and development of nanotechnology-based molecular test equipment (MTE). This is a research effort for testing printed circuit boards independent of traditional automatic test equipment (ATE) through the fabrication of MTE within integrated circuits (ICs). The MTE is embedded within the IC substrate and encapsulated within nanoprobes that connect between the surface and the substrate of the IC at various functional areas. A process is followed whereby IC device simulation is performed to assess the electrical, chemical, and structural properties of integrated and adjacent substrate devices. Through this approach the nominal and failed device performance parameters of interest to substrate-based MTE are found. Discussion of the development and application of MTE within IC architectures is provided, including such topics as the effect of substrate composition on the design and realization of MTE, interfaces between MTE and IC devices, and reporting of MTE results to the IC surface and technician. Potential application areas within different device functions will also be identified. A chemical structure diagram is also provided to illustrate the implementation of MTE using discrete device configurations with MTE-augmented logic     

基于马尔科夫链的自动测试设备可靠性预测

自动测试设备在生产和科研过程中非常重要,其可靠性在科研和生产中有着重要的意义。通过对马尔可夫链的分析,提出了基于马尔可夫链建立的自动测试设备可靠性预测的模型,根据某一阶段的自动测试设备故障数据,对下一阶段该自动测试设备可靠性进行预测,从而得到自动测试设备基于马尔可夫链的可靠性预测结果。     

Evaluation of three ATE test environments

It is often difficult to assess the positive and negative issues facing the use of a particular software test environment in a given application. Much of the literature is swayed by the use of each environment by a single application. This paper will provide detailed information on ARGO Systems evaluation of three popular ATE Test Environments: the Ada Based Environment for Testing (ABET), the TYX PAWS ATLAS test environment and the National Instruments LabVIEW graphical test environment. This evaluation was accomplished by comparing the same test program measurements in each environment using the same UUT, interface test adapter, and the same PC-based ATE. As such, the data represents a true apples-to-apples comparison of these environments