| 基于Markov链的FSM容软错误设计 |
| |
| 引用本文： | 曹源,梁华国,黄正峰,陈秀美,吴珍妮.基于Markov链的FSM容软错误设计[J].宇航学报,2011,32(3). |
| |
| 作者姓名： | 曹源 梁华国 黄正峰 陈秀美 吴珍妮 |
| |
| 作者单位： | 1. 合肥工业大学计算机与信息学院,合肥,230009
2. 合肥工业大学电子科学与应用物理学院,合肥,230009 |
| |
| 基金项目： | 国家自然科学基金资助项目，博士点基金资助项目，国家自然科学基金重点资助项目，安徽省海外高层次人才项目 |
| |
| 摘 要： | 随着深亚微米工艺的广泛应用,持续攀升的软错误率对宇航设备的电路可靠性造成了极大影响.针对现有冗余防护技术面积开销大的不足,将慨率统计的思想运用到有限状态机(FSM)的软容错设计上,提出了选择部分状态冗余的容错方法.在Markov链模型的基础上,计算出各状态概率,从而为状态冗余提供依据.与未经选择状态冗余的电路相比,以平均增加14.9%的面积开销为代价,这种电路可屏蔽87.6%的时序逻辑单翻转(SEU).
|
| 关 键 词： | Markov链模型 状态概率 软错误 状态冗余 |
FSM Soft Fault-Tolerant Design Based on Markov Chain Model |
| |
| CAO Yuan,LIANG Hua-guo,HUANG Zheng-feng,CHEN Xiu-mei,WU Zhen-ni.FSM Soft Fault-Tolerant Design Based on Markov Chain Model[J].Journal of Astronautics,2011,32(3). |
| |
| Authors: | CAO Yuan LIANG Hua-guo HUANG Zheng-feng CHEN Xiu-mei WU Zhen-ni |
| |
| Institution: | CAO Yuan1,LIANG Hua-guo2,HUANG Zheng-feng2,CHEN Xiu-mei1,WU Zhen-ni1 (1.School of Computer and Information,Hefei University of Technology,Hefei 230009,China,2.School of Electric Science and Applied Physics,China) |
| |
| Abstract: | Since deep submicron technology is widely used in microprocessors,increasing soft error rate greatly affects the reliability of controllers.In this paper,the idea of statistical probability is applied to soft fault-tolerant design for finite state machine(FSM).Based on a Markov chain model,a redundancy state selection method is proposed.Compared with the original circuit,this design can mask 87.6% single event upset(SEV) at the cast of additional 14.9% area overhead in average. |
| |
| Keywords: | Markov chain model State probability Soft fault State redundancy |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
|
