| SRAM型FPGA空间应用的抗单粒子翻转设计 |
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| 引用本文： | 胡洪凯,施蕾,董暘暘,刘波,叶有时.SRAM型FPGA空间应用的抗单粒子翻转设计[J].航天器环境工程,2014,31(5):510-515. |
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| 作者姓名： | 胡洪凯 施蕾 董暘暘 刘波 叶有时 |
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| 作者单位： | 1.北京控制工程研究所, 北京 100190 |
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| 摘 要： | SRAM型FPGA容易受到空间辐射环境引起的单粒子翻转(SEU)的影响,造成FPGA逻辑错误和功能中断,因此空间应用时必须对其进行抗单粒子翻转加固设计,提高其空间应用的可靠性。文章综述了几种FPGA抗单粒子翻转的设计方法,包括三模冗余设计、动态刷新设计和动态部分可重构设计等。利用构建的测试系统,验证以上多种FPGA抗单粒子翻转设计方法的工程可实施性。
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| 关 键 词： | FPGA 单粒子翻转 容错设计 可靠性 |
| 收稿时间： | 4/4/2014 12:00:00 AM |
| 修稿时间： | 2014/9/13 0:00:00 |
SEU-tolerant design for SRAM based FPGA on spacecraft |
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| Hu Hongkai,Shi Lei,Dong Yangyang,Liu Bo,Ye Youshi.SEU-tolerant design for SRAM based FPGA on spacecraft[J].Spacecraft Environment Engineering,2014,31(5):510-515. |
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| Authors: | Hu Hongkai Shi Lei Dong Yangyang Liu Bo Ye Youshi |
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| Institution: | 1.Beijing Institute of Control Engineering, Beijing 100190, China |
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| Abstract: | The SRAM-based FPGA is susceptible to single event upsets (SEU).Due to the effects and the errors induced by SEU, the function of the SRAM-based FPGA might be interrupted. The SEU-tolerant methods are designed for space applications, to improve the reliability of the SRAM-based FPGA on spacecraft. This paper reviews several SEU-tolerant methods, such as the triple modular redundancy(TMR) method, the scrubbing method and the FPGA dynamic partial reconfiguration technology. |
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| Keywords: | FPGA single event upset fault-tolerant design reliability |
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