首页 | 本学科首页   官方微博 | 高级检索  
     

一种基于显微图像分析的光波导加工表面粗糙度估计方法
引用本文:刘皓挺,黄 韬,汪飞琴,于文鹏,余 琦. 一种基于显微图像分析的光波导加工表面粗糙度估计方法[J]. 导航与控制, 2015, 14(1): 65-69
作者姓名:刘皓挺  黄 韬  汪飞琴  于文鹏  余 琦
作者单位:1. 北京航天控制仪器研究所,北京,100039
2. 中国航天员科研训练中心,北京,100094
基金项目:国家973计划项目(编号:613186)
摘    要:为进一步提高光波导器件加工的可靠性,降低废品率,提出一种非接触式基于共聚焦显微图像分析的光波导加工表面粗糙度估计方法.首先采用共聚焦相机对光波导感兴趣区域进行拍摄,提取非缺陷图像区域;其次,采用粗糙度测量设备测量器件的表面粗糙度,利用图像处理方法计算提取图像区域的纹理特征,并建立二者结果间对应关系;最后,一旦建立上述关系后,便可采用相机拍摄的图像去估计待测光波导器件表面的粗糙度指标.与传统采用精密光学仪器测量光波导表面粗糙度的方法相比,本文方法不需要在线使用光学测量仪器或昂贵的后处理商业软件,具有低成本、使用方便的特点.实际应用证明了本文所提方法的正确性和有效性.

关 键 词:表面粗糙度  光波导  纹理分析  显微图像  共聚焦相机

A Surface Roughness Evaluation Method of Optic Waveguide Manufacture Based on Microscope Image Analysis
LIU Hao-ting,HUANG Tao,WANG Fei-qin,YU Wen-peng and YU Qi. A Surface Roughness Evaluation Method of Optic Waveguide Manufacture Based on Microscope Image Analysis[J]. Navigation and Control, 2015, 14(1): 65-69
Authors:LIU Hao-ting  HUANG Tao  WANG Fei-qin  YU Wen-peng  YU Qi
Affiliation:Beijing Institute of Aerospace Control Devices;Beijing Institute of Aerospace Control Devices;Beijing Institute of Aerospace Control Devices;Beijing Institute of Aerospace Control Devices;Astronaut Research and Training Center of China
Abstract:To improve the manufacture reliability of optic waveguide and decrease the unqualified product ratio to some extent, a noncontact surface roughness measurement method which uses the confocal microscopy is proposed. First, the confocal microscopy is utilized to capture the interested region of optic waveguide and choose the non-defect regions. Second, the texture features of these non-defect regions are computed, and their corresponding calculation results are compared with those results which are measured by the high precision surface roughness measurement device. Then the relationship between the image features and the measured surface roughness are built. Finally, once the relationship is built, the images captured by the confocal microscopy can be employed to estimate the surface roughness of optic waveguide. In contrast to the measurement method using high precision optic device, our low cost image based surface roughness measurement method can be utilized to implement an offline application rather than the online application of these devices. The practical product applications have proved the correction and effectiveness of this proposed method.
Keywords:surface roughness   optic waveguide   texture analysis   microscope image   confocal microscopy
本文献已被 万方数据 等数据库收录!
点击此处可从《导航与控制》浏览原始摘要信息
点击此处可从《导航与控制》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号