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成败型一次抽样检验方案算法的等价变形
引用本文:李晓阳,姜同敏,肖良华.成败型一次抽样检验方案算法的等价变形[J].北京航空航天大学学报,2005,31(8):904-907.
作者姓名:李晓阳  姜同敏  肖良华
作者单位:北京航空航天大学,工程系统工程系,北京,100083;北京航空航天大学,工程系统工程系,北京,100083;北京航空航天大学,工程系统工程系,北京,100083
摘    要:在确定成败型试验方案时,为解决用尝试法选择可靠性一次抽样检验方案时工作量较大的问题,将确定方案时使用的累加方程组等效为一种可方便利用计算机来进行求解的积分方程组.证明了2组方程组的等价性,给出了相应的计算机求解算法,同时指出了国标所给出的试验方案没有兼顾使用方和承制方双方风险相当,并且也没有提供双方风险不同时的试验方案的不足.针对国标中这些问题,提出了相应的试验方案制定原则.实例验证表明使用该算法和该试验方案制定原则,能够对于工程上任意给定的参数,制定出合理的成败型试验方案.

关 键 词:可靠性  试验  抽样  风险  成败型
文章编号:1001-5965(2005)08-0904-04
收稿时间:2004-04-01
修稿时间:2004年4月1日

Development algorithm of single sampling inspection plan of pass-fail experiment
Li Xiaoyang,Jiang Tongmin,Xiao Lianghua.Development algorithm of single sampling inspection plan of pass-fail experiment[J].Journal of Beijing University of Aeronautics and Astronautics,2005,31(8):904-907.
Authors:Li Xiaoyang  Jiang Tongmin  Xiao Lianghua
Institution:Dept. of System Engineering of Engineering Technology, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
Abstract:In order to determine sampling test plan of pass-fail product more easily and fast, the integral equations equal to the accumulation ones were put forward. Testing plan can be efficiently solved by using these equations on computer. The equality of these two kinds of equations was proved; The numerical algorithm of the integral equations solution was given. By comparing results, which came from the integral equations under different reliability parameters conditions, with corresponding pass-fail testing plans in national standard, it could be found that national standard neither accounted for actual risks of both customers and manufacturers, nor provided testing plans when risks of both sides were unequal. The determination principles of pass-fail sampling plan was proposed: pay attention to risks of customers and manufacturers and make samples least. An application example showed that this method could make reasonable pass-fail sampling plan with the use of these principles when any reliability parameters were given.
Keywords:reliability  testing  sampling  risks  pass-fail
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