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主动光频标的研究进展
引用本文:许晓青,李锁印,赵琳,张晓东.主动光频标的研究进展[J].宇航计测技术,2020,39(3):17-21.
作者姓名:许晓青  李锁印  赵琳  张晓东
作者单位:北京大学电子学系,区域光纤通信网与新型光纤通信系统国家重点实验室,北京 100871
摘    要:传统被动光钟激光锁频系统的频率稳定度最终受限于由布朗运动导致的腔长热噪声,是目前光频标发展面临的主要技术瓶颈之一。主动式新型光频标利用光学谐振腔的弱反馈在原子跃迁能级间形成多原子相干受激辐射,该受激辐射输出信号可直接作为钟跃迁信号使用,相比于被动光钟,主动光中原理上可实现更窄的量子极限线宽,并具有腔牵引抑制优势。分别介绍了国内外在主动光频标研究现状,主要介绍北京大学在该研究方向取得的理论及实验研究进展。为了实现窄线宽连续型主动光频标,提出双波长好坏腔方案减小剩余腔牵引效应对四能级主动光钟的影响,其中Nd:YAG 1 064nm好腔激光和铯原子1 470nm坏腔激光共腔输出,分别工作在好、坏腔区域,好腔激光通过Pound-Drever-Hall(PDH)稳频技术锁定主动光钟谐振腔的腔长,由于坏腔激光相比于好腔激光具有腔牵引抑制优势,因此坏腔激光线宽有望在腔长锁定之后的好腔激光的基础上进一步压窄。目前两套双波长系统的1 470nm钟激光拍频线宽受限于两个谐振腔腔长的相对抖动,为了抑制共模噪声对钟激光拍频信号的影响,并验证采用PDH稳频技术实现腔长锁定的可行性,本文利用相位锁定技术同步两套双波长好坏腔系统的谐振腔腔长,从而消除腔长共模噪声对钟激光拍频线宽的影响,进而分析除剩余腔牵引效应以外的其他因素对1 470nm主动光频标的影响。

关 键 词:主动光频标  双波长好坏腔  相位锁定技术  剩余腔牵引效应  

Estimation on Quality Parameter of Micron-level Grids Pattern Standard Sample
XU Xiao-qing,LI Suo-yin,ZHAO Lin,ZHANG Xiao-dong.Estimation on Quality Parameter of Micron-level Grids Pattern Standard Sample[J].Journal of Astronautic Metrology and Measurement,2020,39(3):17-21.
Authors:XU Xiao-qing  LI Suo-yin  ZHAO Lin  ZHANG Xiao-dong
Institution:State Key Laboratory of Advanced Optical Communication,System and Network,Department of Electronics,Peking University,Beijing 100871,China
Abstract:The paper discussed the method of evaluating the quality parameters of micron-level grids pattern standard samples using CD-SEM as the core equipment.It gave an example to measure the quality parameters in different material and different height with nominal pitches of 3μm,and comparative analyzed the relative factors of the experimental data.Combined with the analysis,it provided a theoretical reference for producing high-quality micron-level grids pattern standard sample.The analysis results show that the method described in this paper is suitable for evaluating the quality parameters of micron-level grids pattern standard samples.
Keywords:Quality parameter                                                                                                                        Micron-level grids pattern standard sample                                                                                                                        Uniformity                                                                                                                        Stability                                                                                                                        Estimation
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