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CRRES卫星内部充电的模拟计算与验证
引用本文:李学胜, 焦维新. CRRES卫星内部充电的模拟计算与验证[J]. 空间科学学报, 2007, 27(4): 309-314. doi: 10.11728/cjss2007.04.309
作者姓名:李学胜  焦维新
作者单位:北京大学地球与空间科学学院空间物理与应用技术研究所,北京100871
摘    要:基于Geant 4软件建立一种用于计算航天器内部充电所产生电场的方法.分析载有IDM仪器的CRRES卫星当时所处的空间电子环境,使用该方法进行内部充电模拟,并将模拟结果与IDM仪器所测得的放电脉冲数据进行对比,不仅验证了该方法的有效性,更重要的是深入认识了引起航天器内部充电的空间环境特征以及材料特性对充放电效应的影响.介质内最大电场的模拟计算结果与CRRES卫星实际观测到的放电现象吻合;在材料的各项参数中,与辐射感应电导率有关的kp系数对稳态电场有很大影响,为了定量研究内部充电效应,需要在实验室精确地测定kp系数;材料的暗电导率、密度以及材料的分子构成等也与内部充电效应有关,对这些参数细致地研究有助于对内部充电效应的认识.

关 键 词:航天器内部充电   Geant 4软件   CRRES/IDM
文章编号:0254-6124/2007/27(4)-309-06
收稿时间:1900-01-01
修稿时间:2006-12-24

Simulation and Validation for CRRES Satellite Internal Charging Effects
LI Xuesheng, JIAO Weixin. Simulation and Validation for CRRES Satellite Internal Charging Effects[J]. Chinese Journal of Space Science, 2007, 27(4): 309-314. doi: 10.11728/cjss2007.04.309
Authors:LI Xuesheng  JIAO Weixin
Affiliation:Institute of Space Physics and Applied Technology, School of Earth and Space Sciences, Peking University, Beijing 100871
Abstract:Firstly,a method based on the Geant 4 software is introduced.It can calculate the electric field arisen from internal charging effects under the special space environment.Secondly, the space electron environment CRRES satellite was located on was analyzed and used to simulate the internal charging effects.Lastly,the attempt has been made to compare the data from the CRRES IDM space experiment and the data from simulation results.This comparation showed that the calculation method is validated and some basic conclusions about the space environment which causes the internal charging effects are drawn.The calculations show that the high-energy electron flux/energy spectra is the primary cause of discharges.The material characteristics,especially the RIC(Radiation Induced Conductivity)and dose rate factor k_p are very important to the steady state electric field.For studying the internal charging effects,need to mensurate these material characteristics accurately in laboratory.
Keywords:Spacecraft charging effect  Geant 4 software  CRRES/IDM
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