Virtex-4系列FPGA纠正单粒子翻转的方法研究 |
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作者姓名: | 陶晓霞 邢炜 徐启炳 |
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作者单位: | 中国空间技术研究院西安分院,西安710000 |
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摘 要: | Virtex-4系列FPGA空间应用中易发生单粒子翻转事件,对设备正常功能的完成带来不良影响。文章给出了单粒子翻转的原理。为解决FPGA单粒子翻转问题,结合工程实践对FPGA抗单粒子3种方法进行了分析和比对,提出了“配置存储区回读CRC结果比对”为最优方法,并给出了示例。同时文章也对FPGA回读及擦洗配置命令序列等关键技术进行了研究。
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关 键 词: | 单粒子翻转 配置数据流 回读 擦洗 |
Research on correcting single-event upsets in virtex-4 platform FPGA |
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Authors: | TAO Xiao-xia XING Wei XU Qi-bing |
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Institution: | ( China Academy of Space Technology ( Xi' an) , Xi' an 710000, |
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Abstract: | In space applications, logic state of static memory element are easily altered by single event upsets (SEU) in Xilinx Inc. Virtex-4 Platform FPGA, which is disadvantage effect on the expected functionality. The theory of SEU is intro- duced in this paper. Based on engineering practice, the optimize method of configuration memory and contrast read back CRC results is proposed after analyzing three anti-SEU methods, and some examples are given. At the same time, some key technologies of read back and scrubbing configuration order list are studied. |
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Keywords: | Single event upsets Configuration bits Read back Scrubbing |
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