| 边界扫描测试技术在集成电路测试中的应用 |
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| 引用本文： | 耿爽,宋金杨,郜月兰.边界扫描测试技术在集成电路测试中的应用[J].沈阳航空工业学院学报,2007,24(2):53-55. |
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| 作者姓名： | 耿爽 宋金杨 郜月兰 |
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| 作者单位： | 1. 东北微电子研究所,辽宁,沈阳,110032
2. 沈阳辽海机械厂,辽宁,沈阳,110001 |
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| 摘 要： | 边界扫描技术是一种新型的VLSI电路测试及可测性设计方法,它提供了对电路板上元件的功能、互连及相互间影响进行测试的一种新方案。介绍了边界扫描技术的原理、结构,讨论了该技术在集成电路测试中的应用。
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| 关 键 词： | 边界扫描 边界扫描测试技术 |
| 文章编号： | 1007-1385（2007）02-0053-03 |
| 收稿时间： | 2006-11-03 |
| 修稿时间： | 2006-11-03 |
The applying of border scanning measurement and data processing in IC test |
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| GENG Shuang,SONG Jin-yang,GAO Yue-lan.The applying of border scanning measurement and data processing in IC test[J].Journal of Shenyang Institute of Aeronautical Engineering,2007,24(2):53-55. |
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| Authors: | GENG Shuang SONG Jin-yang GAO Yue-lan |
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| Institution: | 1. Northeast Microelectronics Institute , Liaoning Shenyang 110032 ; 2. Shenyang Liaohai Manufacture Factory, Liaoning Shenyang 110001 |
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| Abstract: | Boundary-scan technology(BST)is a new and effective way to test and design-for-testability(DFT) for VLSI circuits.It provides a solution plan to test component-functionality,board interconnection and interaction.In this essay,the theory,architecture and its application of BST were introduced. |
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| Keywords: | boundary-scan boroder scanning measurement |
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