| 外加载荷对镀Pt 探针与ZnO纳米棒接触电学特性的影响 |
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| 引用本文： | 姜燕,沈坚,张伟.外加载荷对镀Pt 探针与ZnO纳米棒接触电学特性的影响[J].南京航空航天大学学报,2011,43(6). |
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| 作者姓名： | 姜燕 沈坚 张伟 |
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| 作者单位： | 江苏大学材料科学与工程学院,镇江,212013 |
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| 基金项目： | 国家自然科学基金(11102075)资助项目; 江苏省自然科学基金(BK2011490)资助项目; 江苏大学科研启动基金(10JDG036)资助项目 |
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| 摘 要： | 利用原子力显微镜研究了镀Pt探针与生长在银基底上的单根ZnO纳米棒接触的电学特性.实验测得的Ⅰ-Ⅴ特性曲线呈基本对称的非线性形状,表明镀Pt针尖与ZnO纳米棒顶端形成了良好的肖特基接触.同时,研究发现随着外加载荷的增加,针尖与样品间接触面积增大,使得反向截止电压和正向导通电压均有所升高,而理想因子降低.
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| 关 键 词： | 氧化锌纳米棒 Ⅰ-Ⅴ特性 肖特基 原子力显微镜 |
Effect of Load on Electrical Characteristics of Contacts Between Pt-coated Tip and ZnO Nanorods |
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| Jiang Yan
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Shen Jian
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Zhang Wei.Effect of Load on Electrical Characteristics of Contacts Between Pt-coated Tip and ZnO Nanorods[J].Journal of Nanjing University of Aeronautics & Astronautics,2011,43(6). |
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| Authors: | Jiang Yan Shen Jian Zhang Wei |
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| Institution: | Jiang Yan,Shen Jian,Zhang Wei(College of Materials Science & Engineering,Jiangsu University,Zhengjiang,212013,China) |
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| Abstract: | The electrical characteristics of Pt-coated tip contact to single ZnO nanorod are studied with atomic force microscopy.The measured I-V curves are nonlinear and near symmetric,which indicates a good Schottky contact between Pt tip and ZnO nanorod.When the load is increased,the contact area between the tip and sample gets large.Therefore,the reverse breakdown voltage and the forward voltage go up,and the ideality factor decreases. |
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| Keywords: | ZnO nanorod I-V characterics Schottky atomic force microscope |
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