Evaluation of built-in test |
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| Authors: | Pecht M Dube M Natishan M Williams R Banner J Knowles I |
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| Institution: | CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD; |
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| Abstract: | Built-in test (BIT) provides fault finding as a means to aid in system assembly, test, and maintenance. An investigation to evaluate BIT of a particular electronics board used in the in-flight entertainment system for Boeing 777s is described. We found BIT proved useful when failure occurrences were uniquely associated with the operating environment, situations which can result in no-fault found, or could-not duplicate (CND) failures upon test. We also observed cases where the BIT failed to observe failures, and in some cases pointed to the wrong cause of failure. These and other advantages and disadvantages of BIT implementation are discussed |
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