基于信息流电路可测试性的度量

准确地度量电路的可测试性是数字系统测试的重要问题之一。本文提出了一种基于信息流度量电路可测试性的方法,它表明可以将一个数字电路看成是一个信息处理系统。因此,电路的可测试性的度量值定义为电路输出的平均信息量与输入的平均信息量的最大值之比。文中给出了如何应用逻辑模拟软件来计算电路可测试性的度量值。对于由模块组成的电路,可以通过模块之间的一些特殊操作求得整个电路可测试性的度量值,本文也给出了方法及实例。文中还给出了应用本文提出的方法进行电路可测试性度量的实例,并与文1,5]的方法得到的结果进行了比较,从而说明了本文方法的特点。

A Method Based on Information Flow to Measure Testability of Circuits

To measure testability of circuits precisely is one of the important problems in Digital System Testing. This paper presents a method based on information flow to measure the testability of circuits. Digital circuits can be described by an information processing system. The testability measure is defined in terms of information flow across the digital circuit. Its value can be obtained by means of logic simulation software. For these circuits that contain many modules,the testability measure can be obtained by means of special operations among them. A corresponding example is demonstrated. Another example for testability measure is calculated and its results are compared with that obtained in literature 1, 5]. The feature of the method presented in this paper is then given.