The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft |
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Authors: | N V Kuznetsov |
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Institution: | (1) Skobeltsyn Institute of Nuclear Physics, Moscow State University, Vorob'evy gory, Moscow, 119899, Russia |
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Abstract: | Models and methods in use for quantitative estimates of the occurrence of single event upsets in microchips of orbiting spacecraft are considered. A calculation and experimental technique for determining the rate of these effects is described, taking into account spatial and temporal distributions of the fluxes of high-energy particles in the space and their penetration through protective shields. Examples of its application for the orbit of the International Space Station are presented. |
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