| 卫星电子组件高加速寿命试验技术 |
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| 引用本文： | 郭秀才,冯伟泉,郑会明,杨力坡,李树鹏,马腾飞.卫星电子组件高加速寿命试验技术[J].航天器环境工程,2011,28(5):454-458. |
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| 作者姓名： | 郭秀才 冯伟泉 郑会明 杨力坡 李树鹏 马腾飞 |
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| 作者单位： | 北京卫星环境工程研究所可靠性与环境工程技术重点实验室; |
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| 基金项目： | “十一五”可靠性共性技术预研项目(编号:51319030205) |
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| 摘 要： | 高加速寿命试验(HALT)是一种高效的可靠性试验.通过高加速应力作用,激发产品潜在缺陷变为故障并进行改进,以达到其在使用中几乎不会出现故障的目的.文章阐述了试验的基本原理、试验剖面和失效分析等等,根据航天产品的特点,给出了应力极限确定步骤和温度控制方法,并将该方法在卫星典型电子组件上进行了应用研究.
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| 关 键 词： | 高加速寿命试验 步进应力 工作限 破坏限 试验剖面 电路盒 |
| 收稿时间： | 2011/7/13 0:00:00 |
| 修稿时间： | 9/7/2011 12:00:00 AM |
HALT technology for satellite electronic components |
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| Guo Xiucai,Feng Weiquan,Zheng Huiming,Yang Lipo,Li Shupeng and Ma Tengfei.HALT technology for satellite electronic components[J].Spacecraft Environment Engineering,2011,28(5):454-458. |
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| Authors: | Guo Xiucai Feng Weiquan Zheng Huiming Yang Lipo Li Shupeng and Ma Tengfei |
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| Institution: | Guo Xiucai,Feng Weiquan,Zheng Huiming,Yang Lipo,Li Shupeng,Ma Tengfei (Science and Technology on Reliability and Environmental Engineering Laboratory,Beijing Institute of Spacecraft Environment Engineering,Beijing 100094,China) |
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| Abstract: | High Accelerating Life Test(HALT) is a kind of reliability test with high efficiency.It is used to let the potential defects of products quickly develop into failures through a highly accelerated stress action,and thus to find means to avoid those failures,so that there will be almost no failures during the operation.This paper discusses the basic principle of this kind of test,the test profile and the failure analysis,and provides steps for determining the stress limit and the methods for temperature contr... |
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| Keywords: | HALT step stress operating limit destruction limit test profile circuit unit |
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