SRAM型FPGA单粒子效应试验研究

针对军品级SRAM型FPGA的单粒子效应特性，文中采用重离子加速设备，对Xilinx公司Virtex-II系列可重复编程FPGA中一百万门的XQ2V1000进行辐射试验。试验中，被测FPGA单粒子翻转采用了静态与动态两种测试方式。并且通过单粒子功能中断的测试，研究了基于重配置的单粒子效应减缓方法。试验发现被测FPGA对单粒子翻转与功能中断都较为敏感，但是在注入粒子LET值达到42MeV·cm 2/mg时仍然对单粒子锁定免疫。本文对翻转敏感度、测试方法与减缓技术进行了讨论，试验结果说明SRAM型FPGA对单粒子效应比较敏感，利用重配置技术的减缓方法能够有效降低敏感度，实现空间应用。

Experimental Study of Single Event Effects in SRAM-Based FPGA

Single Event Effect(SEE) characteristics of military SRAM-based FPGA are studied using a heavy-ion test facility.The device evaluated is a 1,000,000 gate Virtex-II reprogrammable FPGA(XQ2V1000) from Xilinx.Details of single event upset are studied in both static and dynamic operating conditions to be able to understand the upset sensitivity.And test of single event functional interrupt is done to develop mitigation strategies based on reconfiguration technique.The FPGA evaluated is sensitive to single event upset and functional interrupt,but it is immune to single event latch-up up to an LET of 42MeV·cm2/mg.In this paper,the upset sensitivity,detection and mitigation techniques are discussed;and the results indicate that the SRAM-based FPGA is good for space applications based on the reconfiguration technique.