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理想导体表面电磁散射的高阶微扰解
引用本文:黄泽贵,童创明,胡国平,常广才.理想导体表面电磁散射的高阶微扰解[J].上海航天,2005,22(6):8-12.
作者姓名:黄泽贵  童创明  胡国平  常广才
作者单位:1. 空军工程大学导弹学院,陕西,三原,713800
2. 陕西电视台,陕西,西安,710016
摘    要:针对经典微扰法(SPM)求解粗糙表面电磁散射特性存在的问题,提出了一种基于二维表面场的一阶和二阶展开近似高阶微扰算法。用该法计算了高阶表面场分量的全极化后向散射SPM解和二阶场分量对水平极化双站及后向散射系数的修正解。研究了不同粗糙度下掠入射时高阶SPM求解的双站散射系数,以及不同方位角下高阶场量的散射特性。通过对合成场的修正,解决了近掠入射条件下散射系数计算的误差。数值计算结果证明该算法有效。

关 键 词:理想导体  粗糙表面  散射系数  高阶微扰法  近掠入射
文章编号:1006-1630(2005)06-0008-05
收稿时间:2005-05-11
修稿时间:2005-05-112005-07-26

High-Order Small Perturbation Method for Perfectly Conducting Rough Surface
HUANG Ze-gui,TONG Chuang-ming,HU Guo-ping,CHANG Guang-cai.High-Order Small Perturbation Method for Perfectly Conducting Rough Surface[J].Aerospace Shanghai,2005,22(6):8-12.
Authors:HUANG Ze-gui  TONG Chuang-ming  HU Guo-ping  CHANG Guang-cai
Abstract:To solve the problem in electromagnetic scattering calculation by classical small perturbation method(SPM),a new high-order SPM was put forward based on first-order and second-order expansion approximation of 2-dimensional surface electric field in this paper.The full polarized backscattering coefficient of high-order surface electric field and horizontal polarized backscattering coefficient correction of second-order electric field were computed by this new method.The bistatic scattering coefficient solved in grazing incident for various surface roughness by high-order SPM and scattering characteristic of high-order electric field in different azimuth angle were discussed.The error in scattering coefficient calculation in low-grazing incident was corrected by modification of electric field integration.The numerical computation results showed that the method in this paper was effective.
Keywords:Ideal conductor  Rough surface  Scattering coefficients  High-order SPM  Low-grazing incident
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