| 基于CCD和光栅尺的布氏硬度测量装置 |
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| 引用本文： | 陶继增,石伟,李金颖.基于CCD和光栅尺的布氏硬度测量装置[J].航空计测技术,2011(6):18-20. |
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| 作者姓名： | 陶继增 石伟 李金颖 |
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| 作者单位： | 中航工业北京长城计量测试技术研究所,北京100095 |
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| 基金项目： | “十一五”技术基础计量科研项目资助 |
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| 摘 要： | 将CCD和光栅尺同时应用于布氏硬度压痕测量,试验证明：系统测量结果基本不受CCD对焦及照明光强变化的影响;测量准确度容易保证,重复性好,自动化程度及效率较高,同时大大缓解了布氏硬度测量中的视觉疲劳。
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| 关 键 词： | CCD 光栅尺 布氏硬度 |
The Brinell Hardness Measurement Device Based on CCD and Grating Ruler |
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| TAO Jizeng,SHI Wei,LI Jinying.The Brinell Hardness Measurement Device Based on CCD and Grating Ruler[J].Aviation Metrology & Measurement Technology,2011(6):18-20. |
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| Authors: | TAO Jizeng SHI Wei LI Jinying |
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| Institution: | (Changcheng Institute of Metrology ＆ Measurement,Beijing 100095,China) |
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| Abstract: | The CCD and grating ruler were applied to Brinell Hardness measurement in this paper.It was proved that the change of focus and illumination intensity of CCD have little influence on the hardness result.The measurement precision and repeatability were easily realized.As the hardness was measured more automatically and efficiently,the visual fatigue was alleviated. |
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| Keywords: | CCD grating ruler Brinell Hardness |
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