COTS处理器单粒子效应检测系统设计

商用现货（COTS）处理器应用于星载计算机主控制器前须经过地面单粒子效应试验验证。与同等价位的宇航级处理器相比，COTS处理器具有集成度高、功能复杂、接口丰富的特点，需要为其定制化设计单粒子效应试验测试系统。文章针对COTS处理器的片内存储器、寄存器数量万倍于宇航级处理器以及接口功能更加丰富的特点，确定单粒子锁定（SEL）测试、存储器翻转测试、寄存器翻转测试、典型指令集测试和接口功能测试作为试验测试项；并提出一套单粒子效应试验测试系统方案，实现了对被测处理器的各路供电电流、存储器、寄存器和外部接口功能的有效测试和监控。

Design of a single event effects detection system for COTS processor

Commercial off-the-shelf (COTS) processor needs to be verified by ground-based single event effects (SEE) test before being used in the main controller of the space-borne computers. Compared with the space-level processors of the same price, COTS processors have the characteristics of high integration, complex functions, and rich interfaces. Therefore, it is necessary to customize the design of a SEE test system for it. In this paper, based on the characteristics that the number of COTS processor’s on-chip memory and register are ten thousand times more than that of the space-level processor and that the interface functions of COTS processor are more abundant, single event latchup (SEL) test, memory flip test, register flip test, typical instruction set test, and interface function test were selected as the test items. A set of SEE test system was proposed to effectively test and monitor the power supply current, memory, register, and external interface function of the tested processor.