| 基于离子污染度数据分析的航空电子产品水清洗质量提升技术 |
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| 引用本文： | 丁诗炳,张德晓.基于离子污染度数据分析的航空电子产品水清洗质量提升技术[J].航空电子技术,2021,52(1):52-56. |
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| 作者姓名： | 丁诗炳 张德晓 |
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| 作者单位： | 中国航空无线电电子研究所,上海200241 |
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| 摘 要： | 本文应用ROSE/SEC法测试航空电子产品印制板组件(PCBA)的离子污染度,以测试结果反映水清洗效果,通过工序能力指数Cpk对工艺参数进行评价,同时运用统计过程控制(SPC)对清洗工序进行监控,实现对航空电子产品水清洗工艺清洗质量的提升.试验结果表明,降低PCBA相互遮挡面积可有效降低离子污染度.结合Xbar-S控制...
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| 关 键 词： | 离子污染度 水清洗 Cpk值 统计过程控制 |
| 收稿时间： | 2020/11/2 0:00:00 |
| 修稿时间： | 2021/3/9 0:00:00 |
Avionics Products Cleaning Process Quality Improvement Technology Based on Ion Contamination Test Data Analysis |
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| DING Shi-bing,ZHANG De-xiao.Avionics Products Cleaning Process Quality Improvement Technology Based on Ion Contamination Test Data Analysis[J].Avionics Technology,2021,52(1):52-56. |
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| Authors: | DING Shi-bing ZHANG De-xiao |
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| Institution: | China National Aeronautical Radio Electronics Research Institute, Shanghai 200241, China |
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| Abstract: | ROCE/SEC ion contamination test method isapplied to reflect the cleaning effectofavionics printed circuit board assembly (PCBA).Process parameters areevaluated by complex process capability index Cpk value, and the cleaning process ismonitored by statistical process control, so as to improve the quality of avionics productscleaning process. The results show that reducing PCBAs shielding area can effectively reduce the ion contamination level. By using Xbar-S control chart detect and identify abnormal factors in the process, quality problems caused by abnormal factors can be eliminated in advance, so as to improve the quality of PCBA water cleaning process. |
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| Keywords: | ion contamination water cleaning Cpk value statistical process control |
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