电大尺寸平面数字相控阵外场通道校准测试方法

电大尺寸平面数字相控阵通道校准测试对暗室规模和质量要求极高,扫描架探针移动速度受限导致通道校准的暗室测试时间长达数小时,且长时间测试引起的温度变化会造成通道相位漂移从而导致测试结果不准确。针对存在的问题,提出了一种外场通道校准测试方法,整个阵面中所有通道单次校准测试仅需几分钟,可有效解决由于长时间测试引起的温度变化进而造成的通道相位漂移问题,并通过引入基准通道来解决外场通道校准测试中存在的收发不同源问题。测试方法可有效缩短电大尺寸平面数字相控阵的通道校准时间,提高测试准确性,降低天线测试过程中的时间成本和暗室硬件建造成本。最后,通过某Ka频段电大尺寸平面数字相控阵测控系统的外场测试,验证了方法的可行性和正确性。

A testing method of channel calibration for electrically large planar digital phased array in outdoor

Channel calibration testing of electrically large planar digital phased array has extremely high requirements for the scale and quality of the microwave anechoic chamber. The limited speed of the scanning probe results in channel calibration tests conducted in microwave anechoic chamber lasting several hours. Further more, the temperature changes caused by prolonged testing can cause channel phased drift, leading to accurate test results. In response to the existing problems, this paper proposed an outdoor channel calibration testing method, and single calibration of all channels in the entire array only takes a few minutes, which can effectively solve the problem of channel phased drift caused by temperature changes caused by prolonged testing. By introducing a reference channel, the problem of receiving and transmitting difference in sources in outdoor calibration testing can be solved. This method not only effectively shortens the channel calibration time of electrically large planar digital phased arrays and improve the accuracy in test, but also reduces the time cost and microwave anechoic chamber hardware construction cost in the testing process. Finally, the feasibility and correctness of this method were verified through the Field test results of an electrically large planar digital phased array measurement and control system in Ka-band.