基于时间应力分析的机内测试系统综合降虚警技术

 虚警率高是困扰机内测试（BIT）系统得到广泛应用的主要原因。针对该问题，从机电系统所承受时间应力的角度构建了机内测试系统综合降低虚警技术的总体模型。首先采用双支持向量机（SVM）的方法将实时应力信息与机内测试诊断结果相互关联。在此基础上，提出了基于核主元模糊聚类的虚警识别方法将机电系统多源信息进行综合分析，并通过优化决策实现多级降低机内测试系统虚警的目的。最后，针对某型直升机航空地平仪的机内测试系统进行了试验验证与分析。

Combined False Alarm Reducing Technology for Built-in Test System Based on Time Stress Analysis

The high rate of false alarm is the main problem that influences the performance of built-in test(BIT) system and its wide application.A combined false alarm reducing method for BIT system based on time stress analysis is introduced.A support vector machine(SVM) model is used to correlate the false alarm of BIT to time stress information.On the other hand,a fuzzy clustering analysis based on kernel based principal component analysis is made for false alarm recognition.And then,an optimization multilevel decision model is put forward to reduce the false alarm rate of BIT system.Finally,in order to prove the validity of the false alarm reducing method introduced,an experimental study on BIT system of a helicopter attitude indicator is executed in detail.