| 前放组件高低温测试系统设计 |
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| 引用本文： | 赵自文.前放组件高低温测试系统设计[J].宇航计测技术,2006,26(6):18-21. |
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| 作者姓名： | 赵自文 |
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| 作者单位： | 中国空空导弹研究院,河南,洛阳,471009 |
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| 摘 要： | 对前放组件高低温测试系统设计开发的背景及意义作了简单介绍,并阐述了系统的组成结构及测量原理;详细地论述了测试系统中标准设备的选取、专用设备和夹具的设计思路,最后对测试系统的接地和屏蔽进行了概括总结。
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| 关 键 词： | 温度测量 ~ 前放组件 ~ 测试系统 接地与屏蔽 |
| 文章编号： | 1000-7202(2006)06-0018-04 |
| 修稿时间： | 2006年7月30日 |
Design of Test System for Pre-amplifier Assembly Under High-Low Temperature Environment |
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| ZHAO Zi-wen.Design of Test System for Pre-amplifier Assembly Under High-Low Temperature Environment[J].Journal of Astronautic Metrology and Measurement,2006,26(6):18-21. |
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| Authors: | ZHAO Zi-wen |
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| Abstract: | The background and significance of test system for pre-amplifier assembly under high-low temperature environment are introduced,and its composition structure and testing principles are discussed.The selection of standard equipments and design of special equipment and jig are presented in detail.At last,grounding and shielding of test system are summarized. |
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| Keywords: | Temperature measurement ~ Pre-amplifier assembly ~ Test system Grounding and shielding |
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