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计算机RAM检错纠错电路的设计与实现
引用本文:刘淑芬,崔星.计算机RAM检错纠错电路的设计与实现[J].航天控制,2003,21(4):59-67.
作者姓名:刘淑芬  崔星
作者单位:北京控制工程研究所,北京,100080
摘    要:分析了在空间环境下影响RAM可靠性的主要因素及主要故障模式,介绍了利用FPGA实现RAM 检错纠错电路的方法,给出了仿真结果,并将此方法同用中小规模集成电路实现RAM EDAC的方法进行了比较。

关 键 词:计算机  RAM  EDAC  设计  仿真  FPGA
修稿时间:2003年6月6日

Design and Realization of Error Detection and Correction Circuit for Computer RAM
Liu Shufen,Cui Xing Beijing Institute of Control Engineering,Beijing.Design and Realization of Error Detection and Correction Circuit for Computer RAM[J].Aerospace Control,2003,21(4):59-67.
Authors:Liu Shufen  Cui Xing Beijing Institute of Control Engineering  Beijing
Institution:Liu Shufen,Cui Xing Beijing Institute of Control Engineering,Beijing 100080
Abstract:In this paper, the main factors affecting the reliability of RAM as well as the failure modes in the space environment are demonstrated. The RAM EDAC circuit implement- ed by FPGA is introduced. At the same time, it is compared with that realized by small and medium-scale integrated circuits. Further more, the simulationt rdsults are given.
Keywords:Computer  SRAM  EDAC  Simulation  
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