| 集成电路测试系统程控直流电源校准技术研究 |
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| 引用本文： | 吴丹.集成电路测试系统程控直流电源校准技术研究[J].航空计测技术,2012(3):50-54. |
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| 作者姓名： | 吴丹 |
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| 作者单位： | 武汉数字工程研究所,湖北武汉430074 |
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| 摘 要： | 介绍了集成电路测试系统中程控直流电源的结构、工作原理,分析了影响程控直流电源准确校准的因素,提出采用开尔文连接校准程控直流电源的方法。根据该原理对ASL3000集成电路测试系统进行了校准实验,通过对测量结果的不确定度进行分析,证实了测量结果的准确性和可靠性。
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| 关 键 词： | 集成电路测试系统 程控直流电源 校准 开尔文连接 测量不确定度 |
Research of Calibration Technology for Programmable DC Source of IC Test System |
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| WU Dan.Research of Calibration Technology for Programmable DC Source of IC Test System[J].Aviation Metrology & Measurement Technology,2012(3):50-54. |
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| Authors: | WU Dan |
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| Institution: | WU Dan(Wuhan Digital Engineering Institute,Wuhan 430074,China) |
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| Abstract: | The architecture and principles of operation of the programmable DC source in the IC test system are described,and the factors that affect the calibration accuracy of the programmable DC source are analyzed.This paper also provides a kind of method to calibrate the programmable DC source with Kelvin connections.According to the theory,some calibration experiments on ASL3000 IC test system were made.The assessment of measurement uncertainty proved that the result of measurement was precise and reliable. |
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| Keywords: | IC test system programmable DC source calibration Kelvin connections uncertainty of measurement |
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