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酚醛树脂固化度的X射线衍射分析
引用本文:金春玲 徐辉. 酚醛树脂固化度的X射线衍射分析[J]. 宇航材料工艺, 1997, 27(2): 54-56
作者姓名:金春玲 徐辉
作者单位:北京卫星制造厂!北京,100081,航天材料及工艺研究所!北京,100076,航天材料及工艺研究所!北京,100076
摘    要:发展使用X射线衍技术对酚醛树脂固化度进行研究,确定了酚醛树脂固化度与X射线散射最大值的 关系,得出了利用2θ角来标定树脂固化度的公式。该方法具有快速、无损、灵敏度主同的优点,并可适用于各种不同的酚醛树脂。

关 键 词:酚醛树脂 固化度 X射线衍射 散射最大值

X-ray Diffraction Analysis of the Curing Degree of Phenolic Resin
Jin Chunling. X-ray Diffraction Analysis of the Curing Degree of Phenolic Resin[J]. Aerospace Materials & Technology, 1997, 27(2): 54-56
Authors:Jin Chunling
Affiliation:Jin Chunling (Beijing Satellite Plant Beijing 100081) Xu Hui (Aerospace Research Institute of Materials and Processing Technology Beijing 100076)
Abstract:This paper presents a study of the curing degree of phenolic resin by X-ray diffrac-tion analysis technique. Relationship between the curing degree of phenolic resin and maximum X-ray scattering value has been defined- A formula of the curing degree of phenolic resin, calibrated by scattering angle 20, has been obtained. This method has the advantage of quickness, nonde-struction and hige sensitivity. This method can also be used in other kinds of phenolic resin.
Keywords:Phenolic resin   Curing degree   X-ray diffraction   Maximum scattering value
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