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基于网格的电路功能可靠性仿真系统
引用本文:孙宇锋,杨立波,赵广燕.基于网格的电路功能可靠性仿真系统[J].北京航空航天大学学报,2005,31(12):1337-1341.
作者姓名:孙宇锋  杨立波  赵广燕
作者单位:北京航空航天大学,工程系统工程系,北京,100083;北京航空航天大学,工程系统工程系,北京,100083;北京航空航天大学,工程系统工程系,北京,100083
摘    要:功能可靠性仿真是建立系统功能与可靠性一体化分析的综合仿真技术,论述了电路功能可靠性仿真系统的体系结构、功能及其实现的故障建模、故障虚拟注入、仿真器集成、故障自动判别等主要技术方法.为解决电路功能可靠性仿真系统中长仿真时间和大数据量存储的难点,提出了基于网格计算技术的体系结构,研究了仿真服务、分析服务和数据管理服务的实现方法,建立了通过网格平台向电路功能可靠性仿真系统提供虚拟计算和存储的能力,减少了系统分析所需要的仿真时间,实现了大量仿真结果数据的分布式存储.基于上述技术思想,实现了以TyrensGrid为网格平台、PSpice为仿真内核的TG-CFRS软件原型,证明了基于网格的电路功能可靠性仿真技术的有效性.

关 键 词:网格  可靠性分析  功能可靠性仿真  电子设计自动化
文章编号:1001-5965(2005)12-1337-05
收稿时间:2004-10-13
修稿时间:2004年10月13日

Circuit functional reliability simulation based on grid
Sun Yufeng,Yang Libo,Zhao Guangyan.Circuit functional reliability simulation based on grid[J].Journal of Beijing University of Aeronautics and Astronautics,2005,31(12):1337-1341.
Authors:Sun Yufeng  Yang Libo  Zhao Guangyan
Institution:Dept. of System Engineering of Engineering Technology, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
Abstract:The functional reliability simulation(FRS) is an advanced integrative simulation and analysis technology in reliability by integrating functional simulation with reliability analysis of system.The architecture and functions and mostly realization methods were discussed,such as failure modeling,virtual failure rejection,simulator integration,failure automatic criterion about FRS.In order to resolve the problems about simulation time and data storage,a new architecture was put forward,which is based on the grid technology,and the related service of simulation,analysis,data management and so on was represented.The grid provides a virtual capability of computing and storage.The new architecture shortens the simulation time and realizes the distributed data storage.The Tyrensgrid circuit functional reliability simulation(TG-CFRS) system was produced based on the idea,which makes the Tyrensgrid as the grid platform and PSpice as the simulation kernel and proves the availability of the new architecture.
Keywords:grid  reliability analysis  functional reliability simulation  electron design automation
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