40 keV质子辐照对HfO2/SiO2高反射薄膜激光损伤性能影响试验研究

在低地球轨道，低能质子辐照是造成空间光学元器件损坏的重要因素之一。激光高反射薄膜是空间激光系统中激光产生和输出部件的重要组成部分，其激光损伤性能变化直接影响激光系统的稳定性。文章采用地面空间环境模拟装置模拟低能（40 keV）质子单独作用效果，通过定点原位测量技术和光热吸收测试获得薄膜的光谱透射率、表面形貌和光热吸收特性，采用激光损伤阈值测量方法表征微小初始破坏的激光损伤阈值及损伤形貌；结合SRIM程序模拟计算粒子在材料中输运的具体过程，定量分析过程中的能量损失情况。试验结果表明，40 keV质子辐照会造成HfO₂/SiO₂三波段高反膜的激光损伤阈值明显降低。

Experimental study of the effects of 40 keV proton irradiation on laser damage properties of HfO2/SiO2 high reflective films

In the low Earth orbit, the low-energy proton irradiation is an important factors for the damage of the space optical elements. The laser highly reflective film is an important part of the space laser system for the laser generation and output. Its performance directly affects the stability of the laser system. In this paper, the ground space environmental simulation device is used to simulate the effect of the proton (40 keV) acted below. The surface morphology and the photothermal absorption characteristics are obtained by the fixed-point in-situ measurement and the photothermal absorption test. The laser damage threshold measurement is made to characterize the laser damage threshold and the damage morphology of small initial damages. The specific process of the particle transport in the material is simulated by using the SRIM program, and the energy loss in the process is quantitatively analyzed the experimental results show that the 40 keV proton irradiation eventually has a significant effect on the laser damage properties of the HfO₂/SiO₂ three-band high reflectivity films.