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特种材料表面镀TiN薄膜的结构与应力研究
引用本文:崔砚. 特种材料表面镀TiN薄膜的结构与应力研究[J]. 导航与控制, 2010, 0(2): 67-71
作者姓名:崔砚
作者单位:北京航天控制仪器研究所
摘    要:本文采用多弧离子镀技术在特种材料表面制备TiN薄膜。利用扫描电镜和X射线衍射仪对TiN薄膜的形貌、成分结构、残余应力进行研究,结果表明:薄膜表面粗糙度较大;薄膜由TiN单相组成,以(111)晶面为主;TiN薄膜存在较大残余压应力,经过保温热处理后,薄膜的残余应力显著下降。

关 键 词:多弧离子镀;TiN薄膜;热处理;残余应力

Research on Structure and Residual Stress of TiN Films Deposited on Particular Substrate
CUI Yan. Research on Structure and Residual Stress of TiN Films Deposited on Particular Substrate[J]. Navigation and Control, 2010, 0(2): 67-71
Authors:CUI Yan
Affiliation:Beijing Institute of Aerospace Control Device
Abstract:TiN films deposited on particular substrate using Multi-Arc ion plating system was introduced in this paper. The structure and residual stress of TiN films were analysed by SEM and X-ray diffraction (XRD). The results showed that the phase of TiN films prepared were single TiN and most of the orientation of TiN films was (111); great residual stress exsits in TiN films prepared by Multi-Arc ion plating system and residual stress of TiN films decreases after heat treatment.
Keywords:
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