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弹用电磁继电器贮存退化试验及其寿命预测方法
引用本文:王召斌,符赛,尚尚,翟国富. 弹用电磁继电器贮存退化试验及其寿命预测方法[J]. 北京航空航天大学学报, 2016, 42(12): 2610-2619. DOI: 10.13700/j.bh.1001-5965.2015.0789
作者姓名:王召斌  符赛  尚尚  翟国富
作者单位:1.江苏科技大学 电子信息学院, 镇江 212003
基金项目:China(15KJB470003),China Postdoctoral Science Foundation(2015M571898),Open Foundation of Zhejiang Provincial Top Key Academic Discipline of Mechanical Engineering and Zhejiang Sci-Tech University Key Laboratory (ZSTUME01A02)国家自然科基金(51507074),江苏省高校自然科学研究面上资助项目(15KJB470003),中国博士后科学基金(2015M571898),机械工程浙江省重中之重学科和浙江理工大学重点实验室开放基金(ZSTUME01A02)
摘    要:弹用电磁继电器(EMR)是国防武器系统中重要的机电元件,负责信号传递、电路保护与控制、负载切换等功能,对弹用EMR贮存可靠性的可靠评估已成为亟待解决的问题。以装备应用普遍的某型弹用EMR为例,提出一种考虑性能退化的贮存可靠性试验和评价方法。通过研制的弹用EMR贮存退化试验综合系统,获得了其贮存退化敏感参数的变化情况,对弹用EMR的贮存可靠性建模方法进行了探索性研究。提出了基于时间序列分析和小波变换方法的实测参数预处理方法,提高了预测精度。通过回归理论估计了贮存退化模型的参数,并用所建模型对弹用EMR正常温度应力下的贮存寿命进行了预测。 

关 键 词:电磁继电器(EMR)   接触电阻   贮存可靠性   退化试验   自回归滑动平均(ARMA)模型   小波变换   寿命预测
收稿时间:2015-12-01

Storage degradation testing and life prediction for missile electromagnetic relay
WANG Zhaobin,FU Sai,SHANG Shang,ZHAI Guofu. Storage degradation testing and life prediction for missile electromagnetic relay[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(12): 2610-2619. DOI: 10.13700/j.bh.1001-5965.2015.0789
Authors:WANG Zhaobin  FU Sai  SHANG Shang  ZHAI Guofu
Affiliation:1.School of Electronics and Information, Jiangsu University of Science and Technology, Zhenjiang 212003, China2.Postdoctoral Research Station of Mechanical Engineering, Zhejiang Sci-Tech University, Hangzhou 310018, China3.School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China
Abstract:Missile electromagnetic relay (EMR) is one of the key electromechanical components used for signal transmission, load switching and circuit protection in defense weapon system. How to reliably evaluate the storage reliability of missile EMR has become the most important problem that is urgent to be solved. This study used missile EMR as research object. A new method for testing storage reliability is proposed by performance parameters degradation. The test and analysis system of missile EMR storage parameters was designed and developed. Based on the analysis of parameters changing in storage degradation testing, the modeling storage reliability method of missile EMR is extensively investigated. Prediction parameters preprocessing method is proposed which is based on time series analysis with wavelet transform method. And in this way, the prediction accuracy is increased. Parameters of the storage degradation model are estimated through the regression theory, and the storage life of missile EMR under normal stress is predicted.
Keywords:electromagnetic relay (EMR)  contact resistance  storage reliability  degradation testing  autoregressive moving average (ARMA) model  wavelet transform  life prediction
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