| 微波电子产品贮存状态的SSADT评估方法 |
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| 引用本文： | 李晓阳,姜同敏,黄涛,李庚雨.微波电子产品贮存状态的SSADT评估方法[J].北京航空航天大学学报,2008,34(10):1135-1138. |
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| 作者姓名： | 李晓阳 姜同敏 黄涛 李庚雨 |
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| 作者单位： | 1.北京航空航天大学 工程系统工程系, 北京 100191 |
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| 摘 要： | 针对在贮存期内具有长寿命、高可靠性特点的系统级微波电子产品,为了快速评估其贮存寿命与可靠性指标,提出了使用步进应力加速退化试验(SSADT,Step Stress Accelerated Degradation Testig)的试验方法.首先给出SSADT的基本假设.基于该产品的故障模式影响及危害性分析和故障树分析结果,为该产品确定了加速模型.并结合线性漂移布朗运动的首达时(first passage time)分布服从逆高斯分布的特点,建立了SSADT的可靠性评估模型.其次,根据线性漂移布朗运动的独立增量性,给出了可靠性评估模型参数的极大似然法和最小二乘法相结合的评估方法.为了剔除试验中为检测产品性能而引入的通断电对产品贮存寿命与可靠性评估带来的影响,在借鉴可靠性相关标准的基础上,提出了通断电因子退化率折合方法,并得到了线性漂移布朗运动的通断电折合公式.最终的实例证明,采用提出的贮存寿命与可靠性方法能够得到合理的评估结果,从而验证了该方法的正确性.
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| 关 键 词： | 贮存 可靠性 退化 布朗运动 寿命 加速试验 通断电 |
| 收稿时间： | 2007-09-27 |
Storage life and reliability evaluation of microwave electronical product by SSADT |
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| Li Xiaoyang,Jiang Tongmin,Huang Tao,Li Gengyu.Storage life and reliability evaluation of microwave electronical product by SSADT[J].Journal of Beijing University of Aeronautics and Astronautics,2008,34(10):1135-1138. |
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| Authors: | Li Xiaoyang Jiang Tongmin Huang Tao Li Gengyu |
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| Institution: | 1.Dept. of System Engineering of Engineering Technology, Beijing University of Aeronautics and Astronautics, Beijing 100191, China2. Institute of Remote-Sensing Equipment, Beijing 100854, China |
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| Abstract: | High storage reliability system requires the extremely high reliable assemblies over long periods of storage time.Within severe time and cost constraints,step stress accelerated degradation testing(SSADT) was utilized to evaluate storage reliability and life of microwave electronical assembly.Firstly,the assumptions of SSADT were given.On the basis of failure mode effect and criticality analysis(FMECA) and fault tree analysis(FTA) results of the microwave assembly,accelerated model was determined.Then,relia... |
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| Keywords: | storage reliability degradation Brown movement life accelerated testing power cycle |
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