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基于DFT的含FPGA电路板的测试方法研究
引用本文:蔡士闯,王学伟.基于DFT的含FPGA电路板的测试方法研究[J].宇航计测技术,2011,31(6):61-64,68.
作者姓名:蔡士闯  王学伟
作者单位:海军航空工程学院控制工程系,烟台,264001
摘    要:随着微电子技术的不断发展,复杂逻辑器件大量应用到武器装备电路板上,电路板结构功能日趋复杂.与此同时,芯片集成度的大幅提高使得外部可接触的引脚越来越少,这就导致常规的测试方法无法实现对该类电路板的有效测试,电路板维修、检测问题日益突出.因此,在电子设备设计的开始阶段就采用可测性技术.针对含FPGA电路板,对基于DFT的测试方法进行了研究.

关 键 词:逻辑器件  电路板  故障诊断  可测性设计

Study on Test Method of FPGA Circuit Board based on DFT
CAI Shi-chuang , WANG Xue-wei.Study on Test Method of FPGA Circuit Board based on DFT[J].Journal of Astronautic Metrology and Measurement,2011,31(6):61-64,68.
Authors:CAI Shi-chuang  WANG Xue-wei
Institution:CAI Shi-chuang WANG Xue-wei(Department of Control Engineering,Naval Aeronautical and Astronautical University,Yantai 264001)
Abstract:With the continuous development of microelectronic technology,more and more complex logic devices are applied to the circuit board of weapons equipment.It makes the growing complexity of the circuit board structure and function,and the traditional method can not be effective for that type of circuit board test.Detection of the circuit board is increasingly prominent.Thus,in the beginning stages of the design of electronic equipment,the technology of the design for testability is introduced.Therefore,for the...
Keywords:Logic divice Circuit board Fault diagnosis Testability design  
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