基于Arrhenius模型的星载电子产品加速寿命试验技术

为满足"高分三号"卫星8年长寿命在轨数据处理需求,须开展针对数据处理单元(DPU)的可靠性设计验证。针对星载DPU,采用基于阿伦尼斯(Arrhenius)模型的加速因子估计方法进行高温加速寿命试验方案设计与分析,并给出故障判定及处理准则。8年加速寿命试验结果验证了DPU产品各项功能和性能满足技术指标。加速寿命试验技术能够在较短的时间内用较低的成本快速估计星载电子产品的可靠性,在航天产品设计中具有广阔的应用前景。

Accelerated life test technology for satellite electronic products based on Arrhenius model

To meet the requirement of the eight-year long life in-orbit data processing for the GF-3 satellite, an accelerated life test should be carried out to validate the reliability design of the onboard data processing unit (DPU). In this paper, a method based on the Arrhenius model is adopted to estimate the accelerating factor of the onboard DPU. The scheme design of the accelerated life test is described. The failure criteria are proposed with suggested measures, as well as the endurance criteria at the end of the lifetime. It is shown that all functions and performances of the DPU of the GF-3 satellite during and after the test meet the technical specifications. In a conclusion, the accelerated life test technology is an effective way to estimate the reliability of the onboard satellite products in a short time with a low cost, thus it can be widely applied in the design of aerospace electronic products in the future.