| 星载电子系统高能质子单粒子翻转率计算 |
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| 引用本文： | 薛玉雄,曹洲,杨世宇.星载电子系统高能质子单粒子翻转率计算[J].航天器环境工程,2005,22(4):192-201. |
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| 作者姓名： | 薛玉雄 曹洲 杨世宇 |
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| 作者单位： | 兰州物理研究所,兰州730000 |
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| 摘 要： | 文章对星栽电子系统空间高能质子单粒子翻转率计算方法进行了研究。总结了13种主要计算质子单粒子翻转率的方法,并对各种算法之间的相似性和差异性进行了比对分析。用Visual Basic语言编程,实现了高能质子单粒子翻转率计算模型软件化,为高能质子单粒子效应加固设计和验证评估提供技术依据。计算了几种典型轨道上的质子单粒子翻转率；在此基础上,与在轨观测数值进行比对分析验证,并分析了质子单粒子翻转率与空间轨道的关系。
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| 关 键 词： | 空间轨道 高能质子 单粒子翻转 单粒子翻转截面 单粒子翻转率 |
| 文章编号： | 1673-1379(2005)04-0192-10 |
| 收稿时间： | 2004/8/20 0:00:00 |
| 修稿时间： | 2004年8月20日 |
CALCULATING HIGH-ENERGY PROTON-INDUCED SEU RATE OF ELECTRONIC DEVICES |
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| XUE Yu-xiong,CAO Zhou,YANG Shi-yu.CALCULATING HIGH-ENERGY PROTON-INDUCED SEU RATE OF ELECTRONIC DEVICES[J].Spacecraft Environment Engineering,2005,22(4):192-201. |
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| Authors: | XUE Yu-xiong CAO Zhou YANG Shi-yu |
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| Abstract: | In the paper,space high-energy proton-induced SEU rate estimate of electronic devices are engaged in research, and 13 primary methods predicting Proton-induced SEU rate are summarized and compared with each other.A tool is developed to assess the ability of semiconductor devices radiation-hardening against SEU.Proton-induced SEU rates of several typical orbits are calculated by estimate software,and compared with on orbit observation data.In addition,the relationships between proton-induced SEU rate and space orbit are analyzed. |
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| Keywords: | space orbit high-energy proton SEU(Single Event Upset) SEU cross section SEU rate |
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