| 光栅的衍射在高分辨力测长仪器中的应用研究 |
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| 引用本文： | 芦志成,刘诗飞,龚良,谢科.光栅的衍射在高分辨力测长仪器中的应用研究[J].宇航计测技术,2004,24(4):11-13,32. |
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| 作者姓名： | 芦志成 刘诗飞 龚良 谢科 |
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| 作者单位： | 江西东华计量测试研究所,南昌,330029 |
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| 摘 要： | 选用高密度光栅产生衍射条纹 ,研究其信号合成、采集及处理的方法以实现在长度计量中 ,纳米分辨力的计数。
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| 关 键 词： | 衍射光栅 动态采数 静态细分 分辨力 |
| 文章编号： | 1000-7202(2004)04-0011-03 |
| 修稿时间： | 2004年5月20日 |
The Application and Research of the Diffraction Grating in Measuring Instruments in Length of High Resolving Power |
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| LU Zhi-cheng,LIU Shi-fei,GONG Liang,Xie Ke.The Application and Research of the Diffraction Grating in Measuring Instruments in Length of High Resolving Power[J].Journal of Astronautic Metrology and Measurement,2004,24(4):11-13,32. |
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| Authors: | LU Zhi-cheng LIU Shi-fei GONG Liang Xie Ke |
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| Abstract: | The method using the diffractive stripe brought by the high consistency of grating and researching the compound, gather and disposal of its signal to achieve the calculation of the resolving power of nanometer in the measurement of length. |
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| Keywords: | Diffractive grating Dynamic sampling Static fractionize Resolving power |
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