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We have aimed to present a comprehensive review of our understanding to date of the formation of DNA strand breaks induced by high LET radiation. We have discussed data obtained from DNA in solution as well as from the formation and "repair" of strand breaks in cell DNA. There is good agreement, qualitatively, between these two systems. Results were evaluated for two parameters: (1) effectivity per particle, the cross section (sigma) in micrometers 2/particle; and (2) the strand break induction frequency as number of breaks per Gy per unit DNA (bp or dalton). A series of biological effects curves (one for each Z-number) is obtained in effectivity versus LET plots. The relationships between induction frequencies of single-strand breaks, or double-strand breaks, or the residual "irrepairable" breaks and LET-values have been evaluated and discussed for a wide spectrum of heavy ions, both for DNA in solution and for DNA in the cell. For radiation induced total breaks in cell DNA, the RBE is less than one, while the RBE for the induction of DSBs can be greater than one in the 100-200 keV/micrometers range. The level of irrepairable strand breaks is highest in this same LET range and may reach 25 percent of the initial break yield. The data presented cover results obtained for helium to uranium particles, covering a particle incident energy range of about 2 to 900 MeV/u with a corresponding LET range of near 16 to 16000 keV/micrometers.  相似文献   
2.
Biochemical mechanisms and clusters of damage for high-LET radiation.   总被引:4,自引:0,他引:4  
Using mechanisms of indirect and direct radiation, a generalized theory has been developed to account for strand break yields by high-LET particles. The major assumptions of this theory are: (i) damage at deoxyribose sites results primarily in strand break formation and (2) damage to bases leads to a variety of base alterations. Results of the present theory compare well with cellular data without enzymatic repair. As an extension of this theory, we show that damage clusters are formed near each double strand break for high-LET radiation only. For 10 MeV/n (LET = 450 keV/micrometer) neon ions, the results show that on average there are approximately 3 additional breaks and approximately 3 damaged bases formed near each double strand break. For 100 MeV/n helium ions (LET = 3 keV/micrometer), less than 1% of the strand breaks have additional damage within 10 base pairs.  相似文献   
3.
The development of the HVS-550 high-performance power supply is described. The HVS-550 was designed and built utilizing state-of-the-art surface mount construction, low-profile magnetics, and aggressive thermal management techniques. This combination allowed the module height to be only 0.58 in. The unique requirements of the military system that bounded the power-supply parameters are discussed. Cooling is provided either by liquid circulating through the chassis or by conduction through the card edges. The measured power supply efficiency is in excess of 85%, with 11-V output. The output noise spectrum is excellent because of noise-cancelling techniques utilized to achieve the level of performance required by the system  相似文献   
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