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New software technologies, such as VISA and IVI, continue to bring the industry toward greater standardization. The benefit to the integrator is reduced costs through reuse of the same hardware and software. The benefit to the customer end-user is lower costs by reducing modification and support through the life-cycle to the test station. However, while we position ourselves for the future with PXI and these software technologies, we must still provide support for VXI, GPIB, and instrument drivers that use current software technologies. Using a number of additional tools such as National Instrument's Measurement and Automation Explorer and Geotest's ATEasy, we can have the power of these tools today while waiting for wider acceptance and support of the newer VISA and IVI technologies. We are just now seeing the development of IVI drivers and the ink is still wet on the VISA specification for PXI. ATEasy provided the structure necessary to use these technologies with the current technology. This paper explores the process of implementing and integrating the system driver and instrument drivers for a PXI-based test station for the TOW2 optical sight sensor.  相似文献   
2.
Automatic Test Equipment (ATE) systems are used to qualify, accept, and troubleshoot electronic products. ATE systems may be in the form of large general-purpose systems that can test a wide variety of products or the more commonly used custom, turnkey systems that are designed for specific test application(s) and requirements. Turnkey ATE systems are labor-intensive; as a result, even a relatively simple turnkey tester is costly and may take months (or even years) to develop, integrate, and deploy. The main reason for this aspect of turnkey ATE systems is that even though the instrumentation may be off-the-shelf components, most everything else is custom and requires design, development, extensive debug and integration. Time and again, systems integrators have tried to find a solution that would combine the cost effectiveness of COTS systems with the flexibility of custom ATE. This paper suggests a solution to this problem and that it is feasible to combine COTS testers with custom requirements. This solution, called CreATE, provides a flexible architecture using COTS components (including instruments, cabling and interfacing products)  相似文献   
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