The Freja ultraviolet imager

Auroral images acquired by satellite instrumentation have proven to be a crucial component of the scientific equiry into the physical processes of the Earth's magnetosphere. TheFreja mission provided an opportunity to extend these measurements into the temporal and spatial regime commonly associated with ground-based optical imagers. Employing the basic procedure used successfully in theViking program allowed image repetition rates of 6 s to be achieved with simultaneous exposure of all pixels within the field-of-view. Typical exposure times of 0.3 s required development of an improved image intensifier system and operational requirements resulted in image formats covering approximately one-third of a spin. Simultaneously exposing two broad-band UV cameras, the instrument generates in its normal operational mode 264.6 kbytes per image pair. Results from initial operations confirm the design approach and suggest such imagers can be routinely included on challenging low cost missions such asFreja.     

质量管理体系建设必须与企业发展战略相适应

提出了质量管理体系建设中存在的问题和解决途径,对不同企业发展战略的质量管理体系进行了比较,指出了质量管理体系建设必须与企业发展战略相适应。     

Towards a coherent remote sensing data policy

Access to space-based remote sensing data is critical for Earth science and the study of global change. This article summarizes a variety of US government Earth science data policies and problems. The authors examine current efforts to develop data policies for the next generation of US remote sensing programmes, noting likely problems based on past experiences. They argue that the goal of US Earth science data policy should be to provide the widest possible dissemination of data. Setting such a goal permits the development of a simple, coherent data policy that serves scientific, commercial and US government interests.     

精密机械零件的统计尺寸公差

精密机械产品的发展要求具有高性能、高可靠性和高质量。如果用设计时减小公关的方法来保证精度，则将难以解决加工和装配中产生的问题。因此需要在采用尽可能大的公差值的民政部下满足精度一文将讨论一些实例，寻找借助于统计尺寸公差降低加工精度要求的办法。     

用于高压动态校准的快开阀装置

介绍一种高压快开阀装置。它可产生３７０ＭＰａ上升时间小于２０μｓ的阶跃压力，用于对高压传感器进行动态校准。     

Use of combined light flash and plasma measurements to study hypervelocity impact processes

We present new measurements concerning generation of light flash during hypervelocity impacts. We use iron particles (10⁻¹³ to 10⁻¹⁷ kg) with velocities over the range 1 to 42 km/s impacting semi-infinite targets (aluminium and molybdenum). The main results of previous work in the field are found to be reproduced with some slight deviations. For iron projectiles with given mass and velocity the energy of the flash (normalized to mass) is proportional to velocity to the power of 3.5 for aluminium targets and 3.9 for molybdenum targets. The duration of the flash is of order 1 microsecond. Simultaneous measurements of the generation of impact plasma do not change this. The onset of plasma generation of the bulk target material does not affect the total light flash energy. We discuss the duration of the flash compared to a simple calculation of temperature in the target and plasma vs time.     

Nanotechnology-based molecular test equipment (MTE)

This paper describes original research efforts in the design, simulation, and development of nanotechnology-based molecular test equipment (MTE). This is a research effort for testing printed circuit boards independent of traditional automatic test equipment (ATE) through the fabrication of MTE within integrated circuits (ICs). The MTE is embedded within the IC substrate and encapsulated within nanoprobes that connect between the surface and the substrate of the IC at various functional areas. A process is followed whereby IC device simulation is performed to assess the electrical, chemical, and structural properties of integrated and adjacent substrate devices. Through this approach the nominal and failed device performance parameters of interest to substrate-based MTE are found. Discussion of the development and application of MTE within IC architectures is provided, including such topics as the effect of substrate composition on the design and realization of MTE, interfaces between MTE and IC devices, and reporting of MTE results to the IC surface and technician. Potential application areas within different device functions will also be identified. A chemical structure diagram is also provided to illustrate the implementation of MTE using discrete device configurations with MTE-augmented logic     

Robust Kalman filter design for predictive wind shear detection

Severe low-altitude wind shear is a threat to aviation safety. Newly developed airborne sensors measure the radial component of wind along a line directly in front of an aircraft. The authors use optimal estimation theory to define a detection algorithm to warn of hazardous wind shear from these sensors. To achieve robustness, a wind shear detection algorithm must distinguish threatening wind shear from less hazardous gustiness, despite variations in wind shear structure. Statistical analysis methods to refine wind shear detection algorithm robustness are presented. Computational methods predict the ability to warn of severe wind shear and avoid false warning. Comparative capability of the detection algorithm as a function of its design parameters is determined, identifying designs that provide robust detection of severe wind shear     

Role of BIT in support system maintenance and availability

The role of built in test (BIT) in electronic systems has grown in prominence with the advances in system complexity and concern over maintenance lifecycle costs of large systems. In an environment where standards drive system designs (and provide an avenue for focused advancement in technology), standards for BIT are very much in an evolutionary state. The reasons for advancing the effectiveness of BIT include reduced support overhead, greater, confidence in operation, and increased system availability. The cost of supporting military electronic systems (avionics, communications, and weapons systems) has driven much of the development in BIT technology. But what about the systems that support these end items that contain test and measurement instrumentation - such as automatic test equipment (ATE), simulators and avionics development suites? There has also been a beneficial effect on the maintenance and availability of these systems due to the infusion of BIT into their component assemblies. But the effect has been much more sporadic and fragmented. This paper looks at the state of BIT in test and measurement instruments, explain its affect on system readiness, and present ideas on how to improve BIT technologies and standards. This will not provide definitive answers to BIT development questions, since the factors that affect it are specific to the instrument itself. The topics covered in this paper are: definitions of built-in test, instrument BIT history, importance of BIT fault coverage and isolation in support systems, overview of BIT development process issues that limit the effectiveness of BIT Standards related to instrument BIT, making BIT more effective in support system maintenance and availability and conclusions.