新一代仪器测试总线-LXI

以太网、标准PC和软件技术日益成熟,并在测试行业中得到了广泛使用.同时,随着IEEE1588网络同步标准的实施、网络接口的标准化普及,基于以太网技术的新一代模块化仪器平台标准-LXI将是新一代测试自动化总线技术标准.论文回顾了测量仪器总线的历史,通过分析LXI和VXI、PXI,给出了LXI总线的特点和优势,并对LXI总线的同步和触发进行了详细地介绍,最后阐述了LXI面临的一些问题,展望了LXI总线的应用前景.     

基于LXI总线的高空模拟试验台的网络化测试

目前,对测试系统的精度和速度要求越来越高,不仅针对测试设备,还针对测试总线。自从20世纪70年代GPIB总线的出现以来,相继推出了VXI、PXI等多种总线技术,使测试效率逐步提高,成本逐年降低,为进一步解决测试设备与被测对象之间距离较远的问题,同时利用现有先进的网络通信技术,安捷伦技术公司和VXI公司联合推出了LXI总线技术。     

新一代仪器总线标准——LXI

介绍了新一代仪器总线标准LXI的产生原因、主要特点,以及LXI仪器的三类仪器定义,对LXI的关键技术同步和触发进行了详细的分析.     

基于TTE端系统的时钟同步设计与实现

随着航空电子体系架构的日益更新,航空机载总线技术得到了飞速发展.时间触发以太网作为新一代的航空总线适合在分布式综合模块化电子系统中应用.时钟同步机制是该网络的核心技术,通过该技术建立的高精度全局同步时钟是保障TTE的数据通信强实时性和确定性的先决条件.本文在分析研究TTE时钟同步算法的基础上,提出了符合SAE AS6802协议标准的TTE端系统的时钟同步机制的设计方案,并在FPGA硬件上得以实现.     

基于LXI总线导弹测试系统设计

阐述了采用LXI总线协议实现某型导弹总体测试系统设计方案。较为全面地分析了仪器总线LXI的特点、体系结构、总线特性和硬件构建方式,具体介绍了基于LXI总线某型导弹测控平台的设计思想、系统结构、关键设计流程和软件编制流程。系统的研制成功,降低了研制成本,满足了某型导弹的试验测试需求,也为后续型号相关测试系统的研制提供了很好的基础。     

航空电子环境TTP/C总线应用技术研究

从航空电子总线协议的发展历程出发,归纳了航空总线协议的特性和发展对航空电子通信的重要意义;根据基于时间触发构架的TTP(Time Triggered Protocol)总线技术的网络和节点结构,结合TTP/C协议调度规则,从实时性、时态完整性、容错特性和冗余可靠性等几个方面,阐述了TTP总线协议在航空电子领域的关键特性。在此基础上,总结了时间触发TTP总线技术在航空电子领域的应用情况,通过对TTP总线技术特性的分析,给出了其对于航空电子领域未来发展的重要意义及未来研究方向的展望。     

基于PCI总线的LXI B类接口模块设计

介绍了在LXI C类接口模块的基础上,设计的基于PCI总线的LXI B类接口模块。重点解决了基于IEEE1588协议的LXI精密时钟同步技术。在模块设计中采用了FPGA对时间信息加盖时戳和直接获取网络数据包的方法,以提高系统的定时精度。该模块可以与传统仪器组合,构成低成本、高性能的LXI仪器。     

基于VXI总线的航空通信导航系统综合检测平台

着重介绍航空通信导航系统综合检测平台的组成.它以VXI总线仪器为主、同时包含GPIB仪器,采用VPC接口技术集成;开发出多个集成度高的TUA,实现了平台的通用性和扩充性,通过一系列自研电路并结合软件平台,使其具有自动化、智能化程度高等特点.     

VXI总线仪器自动计量校准系统的研究

VXI总线仪器由于其性能优越且软，硬件体系具有开放性，在航空，航天，电子通信，交运运输，军事等领域得到广泛的应用。作为一种自动测量设备，VXI总线仪器自身的计量校准也是必要的，不可回避的。本文结合作者的研究课题，阐述了进行VXI总线仪器校准的必要性和特殊性，分析比较了几种VXI总线仪器校准方案，组建了一套自动校准系统，论述了校准软件的结构及软件误差的控制措施，最后展望了VXI总线仪器校准的发展方向。     

机载电气设备ATE的设计和实现

介绍了电气设备ATE系统的软、硬件设计和实现电气设备ATE是一套总线式机载设备地面自动检测系统,采用开放式ATE系统结构,应用VXI和GPIB总线技术和先进的图形化测试软件技术等.     

Future test system architectures

An expanding number of test system architectural choices has caused confusion in the test engineering community. This will show the strengths and weaknesses of existing test system architectures including rack and stack systems with GPIB instruments and modular systems like VXI and PXI. It will provide a glimpse into an emerging new architecture: LAN-based test systems. The paper reviews key concerns such as costs, channel counts, footprints, IO speeds, ease-of-integration, and flexibility. The objective of the paper is to provide engineers insight into the most effective test systems for their future applications.     

VXI or PXI test system improvement using DSP

The results of a study into the use of distributed digital signal processing (DSP) at the instrument level in a VXI and PXI based test system and the effects on test time. One of the limiting factors in testing mixed signal or analog devices using standard bus based instruments is the transfer speed from the instrument to the controlling computer of large amounts of waveform data. This is important as these types of tests use non-deterministic, quantized signals that must be mathematically processed to extract test information. This processing can either be done at the instrument or at the central controller. If the processing is done at the instrument then only the results are transferred to the controller. If the controller does the processing then the raw data must be transferred to and from the instrument. Using two instruments, one in VXI and one in PXI, this paper measures the effects of typical tests contesting the measurements as done in the central processor as opposed to a distributed DSP processor in each instrument For each acquisition instrument, tests were implemented by capturing the data and moving it to the controlling computer where it was processed to extract test results, or by using the instruments on-board DSP so only the final test results were set to the controlling computer. The study results show that a significant improvement in test time can be made by selecting "smart" instruments for the test system when using PXI or VXI based instruments.     

Integrating VISA, IVI and ATEasy to migrate legacy test systems

New software technologies, such as VISA and IVI, continue to bring the industry toward greater standardization. The benefit to the integrator is reduced costs through reuse of the same hardware and software. The benefit to the customer end-user is lower costs by reducing modification and support through the life-cycle to the test station. However, while we position ourselves for the future with PXI and these software technologies, we must still provide support for VXI, GPIB, and instrument drivers that use current software technologies. Using a number of additional tools such as National Instrument's Measurement and Automation Explorer and Geotest's ATEasy, we can have the power of these tools today while waiting for wider acceptance and support of the newer VISA and IVI technologies. We are just now seeing the development of IVI drivers and the ink is still wet on the VISA specification for PXI. ATEasy provided the structure necessary to use these technologies with the current technology. This paper explores the process of implementing and integrating the system driver and instrument drivers for a PXI-based test station for the TOW2 optical sight sensor.     

PXI总线在机载计算机测试系统中的应用

以通用机载计算机的维护和测试为目标,采用目前国际测控领域流行的 PXI 总线结构和 LabWindows/CVI 虚拟仪器软件开发平台,设计和实现了机载计算机通用测试设备。在介绍PXI 总线结构的基础上,重点介绍了该测试设备的软/硬件组成、系统功能和特点。     

机载计算机测试系统的设计和实现

以通用机载计算机的维护和测试为目标,采用目前国际测控领域流行的PX I总线结构和LabW indows/CVI虚拟仪器软件开发平台,设计和实现了机载计算机通用测试设备。本文在介绍PX I总线结构的基础上,重点介绍了该测试设备的软/硬件组成、系统功能和特点。     

用VXI仪器组建通用雷达装备自动测试系统

武器装备的发展对测试系统提出了越来越高的要求。本文介绍了基于VXI总线卡式仪器和GPIB仪器组建的通用雷达装备自动测试系统的硬件结构，说明了测试软件的体系结构和设计方法。     

基于VXI总线的自动测试系统设计

传统测试系统已难以满足目前复杂多样的航空电子设备的测试要求。使用虚拟仪器技术及LabWindows/CVI开发平台,开发了一种基于VXI总线为核心,GPIB总线为辅助的自动测试系统,并从硬件和软件两个方面说明了系统的设计原理和实现方法。系统具有良好的人机交互界面,在使用过程中运行稳定可靠、测试效率高、故障定位快速准确、使用维护方便。     

无线电高度表自动测试与诊断系统

论述了一个基于 GPIB总线测试诊断系统 ,它既可对被测对象进行总体性能测试 ,又可对测试对象进行故障定位 ,系统的通用性和自动化程度较高 ,可应用于部队设备的测试、诊断和维修。     

A new deterministic VXI highway interconnect

Programs based upon the VXIbus modular instrumentation standard are playing a significant role in test systems for both defense and commercial applications. Typical single-chassis VXI systems include an embedded computer-based controller as the system host. Multi-chassis systems generally use a parallel bus or a local area network, such as Ethernet, to interconnect the chassis. An important class of multi-chassis test systems requires high I/O throughput, low latency and a highly deterministic I/O response. This paper describes a new highway interconnect system that includes host computer interface options for VMEbus, EISA and PCI bus. A typical system is configured with a host interface, a fiber-optic highway “loop” and slot-0 controllers in the VXI chassis. The system supports up to 126 VXI chassis, an aggregate I/O throughput of 10 megabytes per second, extremely low latency and a highly deterministic I/O response. Typical applications, including jet aircraft engine testing, missile test systems and high-performance wind tunnel data systems are discussed     

基于PXI及GPIB总线的自动测试系统设计

通过使用自动测试设备来代替大量专用测试设备,不仅可以降低成本,而且可以有效的提高测试效率.介绍了基于PXI总线和GPIB总线的自动测试系统设计,从硬件和软件两个方面详细说明了系统的设计方法.系统具有模块化、层次化和开放式的特点,便于维护和升级.