Automated testing

Since the DoD was the leader in incorporating transistors, ICs and embedded processors, they also were on the forefront in developing automatic test equipment. The term automatic test equipment (ATE) encompasses all phases of computer controlled testing. It is based on the integration of instruments, computers and software. These systems generally include five basic elements: control, stimulus, measurement, switching and software. A special interface device or interface test adapter connects the unit under test (UUT) to the ATE. Test program software connects the ATE to the appropriate UUT test points, programs the input stimulus and monitors the output response     

并行测试系统资源调度引擎的算法设计

并行测试能够显著提高自动测试系统的测试吞吐量和测试效率,本文在介绍分布式多客户端的单处理器并行系统硬件架构和基于ABBET分层的软件标准的自动测试系统软件架构的基础上,对实现资源调度引擎机制的遗传算法等问题进行了论述,并采用Matlab仿真验证了算法的有效性。     

Software architecture for building

Test system developers can benefit greatly from a software architecture that allows for easy interchangeability of instruments in those systems. Using open industry standard software architectures such as Virtual Instrument Software Architecture (VISA), and Interchangeable Virtual Instruments (IVI), developers are able to create systems with interchangeable test instrumentation. This paper describes the VISA and IVI software standards and demonstrates how their use within a broader software architecture, which includes standard development environments and flexible test executive software, facilitates the creation of interchangeable test systems     

Sustainment of legacy automatic test systems: lessons learned on TPS transportability

Sustainment of legacy automatic test systems (ATS) saves cost through the re-use of software and hardware. The ATS consists of the automatic test equipment (ATE), the test program sets (TPSs), and associated software. The associated software includes the architecture the TPSs run on, known as the control software or test station test executive. In some cases, to sustain the legacy ATS, it is more practical to develop a replacement ATE with the latest instrumentation, often in the form of commercial off-the-shelf (COTS) hardware and software. The existing TPSs, including their hardware and test programs, then need to be transported, or translated, to the new test station. In order to understand how to sustain a legacy ATS by translating TPSs, one must realize the full architecture of the legacy ATS to be replaced. It must be understood that TPS transportability does not only include translating the original TPS from an existing language (such as ATLAS) to a new language (such as "C") to run on a new test station, but includes transporting the run-time environment created by the legacy ATS. This paper examines the similarities and differences of legacy ATE and modern COTS ATE architectures, how the ATS testing philosophy impacts the ease of TPS transportability from legacy ATE to modern-day platforms, and what SEI has done to address the issues that arise out of TPS transportability.     

Generic training for ATE technicians

It is argued that the job of an automatic test equipment (ATE) technician is evolving toward that of a computer operator. The technician has automatic tools (test programs) written for every replaceable unit in his test set. The technician selects which test is run. During the test the technician is presented results and given options if a test fails. If the option called out by the test program does not fix the problem, the technician must go back into his tool box (his library of test programs) and select the right tool to do the job. This is true for a technician working on any piece of ATE. It is contended that training for these technicians should be centered around troubleshooting skills with initially less emphasis on the hardware implementation details. These skills could be developed with a genetic trainer     

Analysis tools for the evaluation of maintenance software

Test packages written for built-in test (BIT) and mobile automatic test equipment (ATE) systems for the forward support of electronic and thermal imaging equipment used by the British Army are currently scrutinized and subjected to objective tests by test package evaluation and acceptance teams (TPEATs) before being accepted for field use. This is a time-consuming and costly exercise that can result in the rejection of unsuitable software. The result of such rejection on equipment logistics is for reaching, since the hardware will enter service without adequate maintenance support. In an attempt to address this problem a suite of programs aimed at assisting the verification and validation activities of the TPEAT at every stage of the software life cycle from requirements analysis through to testing and acceptance is being devised. The development of these tools is discussed     

Reconfigurable COTS test systems

Automatic Test Equipment (ATE) systems are used to qualify, accept, and troubleshoot electronic products. ATE systems may be in the form of large general-purpose systems that can test a wide variety of products or the more commonly used custom, turnkey systems that are designed for specific test application(s) and requirements. Turnkey ATE systems are labor-intensive; as a result, even a relatively simple turnkey tester is costly and may take months (or even years) to develop, integrate, and deploy. The main reason for this aspect of turnkey ATE systems is that even though the instrumentation may be off-the-shelf components, most everything else is custom and requires design, development, extensive debug and integration. Time and again, systems integrators have tried to find a solution that would combine the cost effectiveness of COTS systems with the flexibility of custom ATE. This paper suggests a solution to this problem and that it is feasible to combine COTS testers with custom requirements. This solution, called CreATE, provides a flexible architecture using COTS components (including instruments, cabling and interfacing products)     

C-17 successful application of existing automatic test equipment

The C-17 Program utilizes existing B-1B Automatic Test Equipment (ATE). The C-17 decision is in harmony with the Air Force emphasis on reducing proliferation of unique ATE. The ATE selection was made after consideration of cost, performance and supportability tradeoffs. Minimal augmentation of the government inventoried equipment was required which did not affect the existing hardware and software configuration, This approach significantly reduced C-17 program ATE development costs and afforded the program the use of established logistics elements and support structure. The C-17 program demanded concurrency of support structure and aircraft development-the ATE solution met that demand by reducing risks to a manageable level for both test program set development, and Air Force operation and training requirements     

Software architecture requirements for DoD automatic test systems

The DoD has achieved success with recent automatic test equipment (ATE) families, as evidenced by the navy's consolidated automated support system (CASS) and the army's integrated family of test equipment (IFTE) programs. However, as these systems age, the increased requirements for technology insertion due to instrument obsolescence and the demands of advanced electronics are becoming evident. Recent advances in test technology promise to yield reduced total ownership costs (TOC) for ATE which can incorporate the new technology. The DoD automatic test system (ATS) executive agent office (EAO) objective is to significantly reduce total ownership cost. Several objectives have been identified including use of synthetic instruments, support for legacy test product sets (TPSs), and more efficient ways of developing TPSs. The NxTest software architecture will meet the objectives by providing an open systems approach to the system software. This will allow for the incorporation of commercial applications in the TPS development and execution environments and support current advances in test technology     

Evaluation of three ATE test environments

It is often difficult to assess the positive and negative issues facing the use of a particular software test environment in a given application. Much of the literature is swayed by the use of each environment by a single application. This paper will provide detailed information on ARGO Systems evaluation of three popular ATE Test Environments: the Ada Based Environment for Testing (ABET), the TYX PAWS ATLAS test environment and the National Instruments LabVIEW graphical test environment. This evaluation was accomplished by comparing the same test program measurements in each environment using the same UUT, interface test adapter, and the same PC-based ATE. As such, the data represents a true apples-to-apples comparison of these environments     

机载计算机ATE计量校准软件的研究与设计

全面有效地计量校准军用ATE,对保证其正确性有效性非常重要.设计开发ATE计量校准程序,可以实现ATE自动化整体原位校准,提高计量保障效率和测试质量.介绍了机栽计算机ATE计量校准软件的系统结构,重点讨论了计量校准程序结构和面向信号的程序开发方法,最后描述了计量校准程序流程和实现方法.     

Teaching old tricks to new dogs [automatic test equipment]

This describes why transferring test programs and fixtures from obsolete automatic test equipment (ATE) to new equipment are not as simple as it should be. No one would argue that technology has made major advances on test in the last 30 years. Today, speed, overall performance, computing power, and software tools are more sophisticated than 20 or 30 years ago, when the first ATE appeared. As these ATE now head for retirement and as the programs they support still have a long life to live, one would think legacy replacement with new ATE would be a simple task. Unfortunately, this is seldom the case. We realize that old ATE had a number of cards up their sleeves to deal with. For example, high voltage technology, lack of computer aided engineering (CAE) data, requirements for parametric tests, extensive usage of the guided probe, and many other aspects might be not so simple to be reproduced with modern, yet powerful, ATE. The paper shall identify the specific constraints involved with old technology and give examples of success stories where new ATE has been adapted to respond to the challenge. Paraphrasing (in reverse) and old saying, it is like "teaching old tricks to new dogs".     

Software replacement of test module adapters for depot instrumentation due to obsolescence

Depot-level automatic test equipment has been used over the years by various facets of both the government and commercial industry. Over time, the instrumentation used in the depot will need to be repaired or replaced and, oftentimes, the older instruments are no longer serviceable or manufactured. This paper discusses how to replace the obsolete instrument and its associated hardware. Test module adapter with a software module and driver that allows compatibility between the original test executive and the modern instrument without re-hosting existing test program sets. Systems & Electronics, Inc. has implemented this procedure for a digitizer and precision DC power supply on a depot that utilizes the IEEE-488 general purpose interface bus (GPIB) for communication between the control computer and instrumentation.     

NxTest augments legacy military ATE

Typical military automatic test equipment (ATE) usually consists of a number of single channel stimulus and measurement devices connected to the UUT with a switch matrix, providing; traditional serial, parametric test with its lengthy test times. Functional test methodology tests a unit by simulating its environment and verifying that the unit operates correctly in that environment. This requires simultaneous stimulus and measurement capability not usually found in traditional military ATE. Boeing Support Systems is currently in the process of augmenting an existing military test station to provide functional test capability through the use of NxTest technology. This paper will discuss our approach to adding functional test capability to an existing piece of equipment.     

Applying independent verification and validation to the automatictest equipment life cycle

Automatic Test Equipment (ATE) is becoming increasingly more sophisticated and complex, with an even greater dependency on software. With the onset of Versa Modular Eurocard (VME) Extensions for Instrumentation (VXI) technology into ATE, which is supposed to bring about the promise of interchangeable instrument components. ATE customers are forced to contend with system integration and software issues. One way the ATE customer can combat these problems is to have a separate Independent Verification and Validation (IV&V) organization employ rigorous methodologies to evaluate the correctness and quality of the ATE product throughout its life cycle. IV&V is a systems engineering process where verification determines if the ATE meets its specifications, and validation determines if the ATE performs to the customer's expectations. IV&V has the highest potential payoff of assuring a safe and reliable system if it is initiated at the beginning of the acquisition life cycle and continued throughout the acceptance of the system. It is illustrated that IV&V effects are more pronounced when IV&V activities begin early in the software development life cycle, but later application of IV&V is still deemed to have a significant impact. IV&V is an effective technique to reducing costs, schedule, and performance risks on the development of complex ATE, and a “tool” to efficiently and effectively manage ATE development risks. The IV&V organization has the ability to perform a focused and systematic technical evaluation of hardware and software processes and products. When performed in parallel with the ATE development life cycle, IV&V provides for early detection     

自动测试系统通用性的实现技术

文章分析了与开发通用ATS密切相关的标准/规范,从软、硬件两方面讨论了ATS通用性的实现途径,包括硬件配置及接口技术、IVI技术以及面向信号方法。ATS通用性的实现可以实现被测对象的跨平台测试以及测试程序的可移植,能带来显著的军事及经济效益。     

Next generation functional test program development system

While superior-quality functional board test has been a goal for most high reliability electronics manufacturers, the time and effort for generating such test programs using today's tools and processes makes this difficult to achieve in a cost effective manner. This paper will introduce a revolutionary approach to functional board test program development that combines the comprehensiveness of software-based simulation with the speed and simplicity of hardware emulation. The result is a functional Test Program Set development system that can produce high fault coverage, diagnostic test programs in a fraction of the time it takes using traditional techniques, and at a lower unit cost. In this paper we will first provide a brief background on the strengths and weaknesses of current software and hardware TPS development techniques-simulation hot mock-up. Next, the new approach is described in detail and contrasted against the existing techniques. Finally, actual experience to date using a prototyped system is presented     

Using built-in-test to reduce TPS run times and improve TPSreliability

This paper addresses using information derived from Built-in-Test (BIT) to fault diagnose Units Under Test (UUTs), wherever possible. This philosophic approach to diagnostic testing is not new. It has been studied over the past 20 years under the visor of “Integrated Diagnostics”, but it has yet to be truly implemented in a “real life” military diagnostic test environment. The mindset of Test Program Set design engineering, along with customer and contractor management alike, remains “complete diagnostic testing based upon single catastrophic component failure modes”. If we are to generate cost efficient Test Program Sets (TPSs) under reduced military budget constraints, this will have to change! The test engineer must be encouraged to use methodologies to speed up development time and decrease TPS run times. Using present technology, this is possible now, and as the technology matures, will become a truly viable approach in the future. For the purpose of this paper, the author relies heavily on his extensive US Navy Automatic Test Equipment (ATE) and Test Program Set (TPS) experience, as well as on previous studies performed on using BIT to fault diagnose Unit Under Test failures on US Naval Air weapon systems     

导航计算机测试软件的架构设计

为解决多种型号被测产品、在不同测试设备上的测试软件开发的问题，尽可能地缩短开发和调试时间，并确保软件的开发质量，提出了一种针对导航计算机测试这一特定领域，以提高扩展性和重用性为目标的软件架构。该架构提供了统一的测试软件设计和开发方法，规范了软件的实现过程，为测试软件的开发提供了一致性的解决方案。采用组件化的开发方法，将具有复用价值的内容封装为组件，为测试软件开发和运行提供了共享的基础平台；提供了开放式的体系结构，规定了内部的组织结构、组件类别与职责、接口规范、交互方式、组件开发方法，便于软件的扩展和修改。经过工程项目的验证，该架构满足在各种专用测试设备上、针对不同型号被测产品的测试软件快速、高质量开发的需要。     

IVI comes of age: An overview of IVI specifications with current status

IVI stands for Interchangeable Virtual Instruments; the IVI Foundation was formed in 1997 and is a consortium founded to promote standard specifications for programmable test instruments. The foundation focuses on the needs of users who build high performance test systems. By building on existing industry standards, such as VXIplug&play driver concepts, the Foundation's goal is to deliver specifications that simplify interchangeability, provide better performance, and maintainable test programs. To date, only a few IVI drivers have been available. In the past year, the IVI Foundation finished a major revision of it's architecture and has released a blizzard of specifications, increasing its IVI Class specification by 80% and dramatically improving the consistency and quality of released drivers. The DoD has expressed major interest in IVI's success. With the recent successful completion of the current set of specifications, DoD is interested in becoming involved in defining the next set of Class Specifications. The NxTest Working Group lists IVI as a key technical element, and DoD has recently requested that the IVI Foundation consider Electro Optical equipment for their next set of Class Specifications; a Working Group has been formed to more clearly define this activity.