Successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility

In today's world of constrained budgets, one of the problems the military faces is the challenge of trying to maintain organic maintenance capabilities. Historically, the US Air Force has desired to achieve an autonomous capability to maintain the equipment it uses. This has been achieved, traditionally, by setting-up three levels of maintenance: organizational; intermediate (back-shop); and depot. The I-level back-shops often utilize militarized automatic test equipment (ATE) and test program sets (TPSs) to test today's complex aircraft line replaceable units (LRUs). And even though this is still a cost-effective maintenance philosophy, it has become costly to develop militarized ATE. The Department of Defense (DoD) has been very active in trying to reduce the total ownership cost of ATE in the government inventory. One approach is to utilize commercial, instead of Mil-Spec, ATE. However, utilizing commercial ATE at an USAF back-shop is not without its tradeoffs and challenges as it represents a significant deviation from the way the USAF maintenance squadrons are accustomed to "doing business." This paper documents the current success story of replacing the legacy C-17 I-level ATE with a commercial ATE.     

Automated testing

Since the DoD was the leader in incorporating transistors, ICs and embedded processors, they also were on the forefront in developing automatic test equipment. The term automatic test equipment (ATE) encompasses all phases of computer controlled testing. It is based on the integration of instruments, computers and software. These systems generally include five basic elements: control, stimulus, measurement, switching and software. A special interface device or interface test adapter connects the unit under test (UUT) to the ATE. Test program software connects the ATE to the appropriate UUT test points, programs the input stimulus and monitors the output response     

Sustainment of legacy automatic test systems: lessons learned on TPS transportability

Sustainment of legacy automatic test systems (ATS) saves cost through the re-use of software and hardware. The ATS consists of the automatic test equipment (ATE), the test program sets (TPSs), and associated software. The associated software includes the architecture the TPSs run on, known as the control software or test station test executive. In some cases, to sustain the legacy ATS, it is more practical to develop a replacement ATE with the latest instrumentation, often in the form of commercial off-the-shelf (COTS) hardware and software. The existing TPSs, including their hardware and test programs, then need to be transported, or translated, to the new test station. In order to understand how to sustain a legacy ATS by translating TPSs, one must realize the full architecture of the legacy ATS to be replaced. It must be understood that TPS transportability does not only include translating the original TPS from an existing language (such as ATLAS) to a new language (such as "C") to run on a new test station, but includes transporting the run-time environment created by the legacy ATS. This paper examines the similarities and differences of legacy ATE and modern COTS ATE architectures, how the ATS testing philosophy impacts the ease of TPS transportability from legacy ATE to modern-day platforms, and what SEI has done to address the issues that arise out of TPS transportability.     

Teaching old tricks to new dogs [automatic test equipment]

This describes why transferring test programs and fixtures from obsolete automatic test equipment (ATE) to new equipment are not as simple as it should be. No one would argue that technology has made major advances on test in the last 30 years. Today, speed, overall performance, computing power, and software tools are more sophisticated than 20 or 30 years ago, when the first ATE appeared. As these ATE now head for retirement and as the programs they support still have a long life to live, one would think legacy replacement with new ATE would be a simple task. Unfortunately, this is seldom the case. We realize that old ATE had a number of cards up their sleeves to deal with. For example, high voltage technology, lack of computer aided engineering (CAE) data, requirements for parametric tests, extensive usage of the guided probe, and many other aspects might be not so simple to be reproduced with modern, yet powerful, ATE. The paper shall identify the specific constraints involved with old technology and give examples of success stories where new ATE has been adapted to respond to the challenge. Paraphrasing (in reverse) and old saying, it is like "teaching old tricks to new dogs".     

Analysis tools for the evaluation of maintenance software

Test packages written for built-in test (BIT) and mobile automatic test equipment (ATE) systems for the forward support of electronic and thermal imaging equipment used by the British Army are currently scrutinized and subjected to objective tests by test package evaluation and acceptance teams (TPEATs) before being accepted for field use. This is a time-consuming and costly exercise that can result in the rejection of unsuitable software. The result of such rejection on equipment logistics is for reaching, since the hardware will enter service without adequate maintenance support. In an attempt to address this problem a suite of programs aimed at assisting the verification and validation activities of the TPEAT at every stage of the software life cycle from requirements analysis through to testing and acceptance is being devised. The development of these tools is discussed     

Role of BIT in support system maintenance and availability

The role of built in test (BIT) in electronic systems has grown in prominence with the advances in system complexity and concern over maintenance lifecycle costs of large systems. In an environment where standards drive system designs (and provide an avenue for focused advancement in technology), standards for BIT are very much in an evolutionary state. The reasons for advancing the effectiveness of BIT include reduced support overhead, greater, confidence in operation, and increased system availability. The cost of supporting military electronic systems (avionics, communications, and weapons systems) has driven much of the development in BIT technology. But what about the systems that support these end items that contain test and measurement instrumentation - such as automatic test equipment (ATE), simulators and avionics development suites? There has also been a beneficial effect on the maintenance and availability of these systems due to the infusion of BIT into their component assemblies. But the effect has been much more sporadic and fragmented. This paper looks at the state of BIT in test and measurement instruments, explain its affect on system readiness, and present ideas on how to improve BIT technologies and standards. This will not provide definitive answers to BIT development questions, since the factors that affect it are specific to the instrument itself. The topics covered in this paper are: definitions of built-in test, instrument BIT history, importance of BIT fault coverage and isolation in support systems, overview of BIT development process issues that limit the effectiveness of BIT Standards related to instrument BIT, making BIT more effective in support system maintenance and availability and conclusions.     

NxTest augments legacy military ATE

Typical military automatic test equipment (ATE) usually consists of a number of single channel stimulus and measurement devices connected to the UUT with a switch matrix, providing; traditional serial, parametric test with its lengthy test times. Functional test methodology tests a unit by simulating its environment and verifying that the unit operates correctly in that environment. This requires simultaneous stimulus and measurement capability not usually found in traditional military ATE. Boeing Support Systems is currently in the process of augmenting an existing military test station to provide functional test capability through the use of NxTest technology. This paper will discuss our approach to adding functional test capability to an existing piece of equipment.     

基于虚拟仪器的机载模块性能测试系统

针对传统机载设备侧重于功能测试的技术缺陷,提出了一种机载模块性能测试系统。阐述了测试系统的架构设计和基于LabVIEW的算法实现,使用虚拟仪器技术,实现了航空电子总线ARINC429模块中信号性能的自动测试和故障报告。实验结果表明,该系统能有效完成模块信号性能的自动测试与故障报告,提高了航空电子自动测试设备的通用性与可靠性,对未来两级维修体制下的航空电子设备ATE的发展具有一定的现实意义。     

Peripheral emulation extends equipment life [ATE]

The ATE industry can benefit greatly by becoming better informed about the availability, functionality, and reliability of emulated peripheral solutions. Emulated peripherals provide the ability to dramatically extend the life of aging ATE equipment, while making that equipment more reliable, more functional, much easier to use, and much simpler to support. The use of emulated disk drives and tape drives can completely eliminate persistent maintenance headaches, increase ATE station availability and reliability, and provide a reasonably priced technology refresh without costly software modifications or system recertification.     

ATE综合校准系统的软件设计及实现

通用自动测试设备（ATE）的测量准确性、可靠性会直接影响飞机综合保障的质量,因此,对此检测设备进行全面有效的测试校准,是确保测试系统完成任务的关键。为了保障测试数据准确可靠和量值传递统一及实现现场的系统性校准工作,本课题以通用自动测试设备为对象,建立了一套基于虚拟仪器技术基础上的综合校准系统。本文对系统的软件结构设计进行了分析和设计,以LCOD原型生命周期为基础,使用了面对组件的设计模式,设计和实现了软件功能,使得该系统具有一定的兼容性和可移植性,并且为扩展留下了接口,同时保证了校准数据的可靠性和精确性。     

便携式发动机参数模拟器的研制

利用PC104总线系统的特点,以某型航空发动机参数模拟器的研究为工程应用背景,解决适应现代测试技术特点的测试设备的研制问题。该模拟器具有抗恶劣环境、小型轻便、集成化程度高等优点,在实际应用的过程中取得了良好效果。     

CASS: design for supportability

An Automatic Test Equipment (ATE) system that is supportable provides all of the operational requirements necessary to support fleet weapon systems, from installation, to operation and maintenance, to disposal. To be supportable, ATE must then minimize facility, personnel, training, supply support and support equipment impacts. Furthermore, should the ATE fail to operate, impacts to the systems which it supports must also be minimized     

Bridging the gap between ATLAS and C: an open-systems approach toTPS re-host

As the DoD focuses on commercialization and open-architecture standards, the need to migrate existing TPSs from proprietary ATLAS-based platforms to an Open Systems platform becomes more critical. This paper will focus on a solution which leverages COTS software tools and emerging industry standards and technologies to implement object-oriented database tools which enable the conversion of an ATLAS TPS to an ANSI C environment     

An Approach to Built-In Testing

The archiitecture and justification for an approach to built-in testing (BIT) in electronic circuits and systems is presented. The proposed system is capable of on-line fault detection and prediction up to the shop replaceable assembly (SRA) level and is designed to interface with external automatic test equipment (ATE) for off-line fault diagnosis within the SRA. The constituent parts of the BIT system have been extensively simulated and the approach appears to be suitable for hardware implementation both with respect to computational and economic considerations.     

The benefits of using ATE systems in the testing of printed circuitboards

An industry-based pragmatic review is provided of the economic and product-quality consequences of automatic test equipment (ATE) usage in printed circuit board testing. The company selection process, the nature of the industrial participants, and the data collection process are described. The benefits obtained by users are identified. It is demonstrated that the use of ATE systems does result in definable economic and quality-level benefits     

A methodology for addressing support equipment obsolescence

The rapid growth of technology over the last twenty years is providing vastly improved capabilities for both avionics and avionics test systems. Unfortunately, an environment of rapid technological growth breeds a corresponding environment of rapid technological obsolescence. Test systems developed fifteen years ago are becoming increasingly more difficult to support due to obsolescence issues and, additionally, such a test system does not reflect the current state-of-the-art for automatic test equipment. The ability of a test system to evolve is essential to providing cost-effective support systems for electronic systems. The F-15 Tactical Electronic Warfare System (TEWS) Intermediate Support System (TISS) was developed under the Modular Automatic Test Equipment (MATE) guidelines to support the suite of F-15 electronic warfare LRUs. MATE imposed hardware architecture constraints, which were factors that contributed to its abandonment. However, the modular aspect of MATE has provided a system that can easily evolve with technological advancements. Modularity is the cornerstone of modern software systems and this is the aspect that has been exploited in the evolution of the TISS     

C-17 successful application of existing automatic test equipment

The C-17 Program utilizes existing B-1B Automatic Test Equipment (ATE). The C-17 decision is in harmony with the Air Force emphasis on reducing proliferation of unique ATE. The ATE selection was made after consideration of cost, performance and supportability tradeoffs. Minimal augmentation of the government inventoried equipment was required which did not affect the existing hardware and software configuration, This approach significantly reduced C-17 program ATE development costs and afforded the program the use of established logistics elements and support structure. The C-17 program demanded concurrency of support structure and aircraft development-the ATE solution met that demand by reducing risks to a manageable level for both test program set development, and Air Force operation and training requirements     

国外机载设备ATS测试软件确认方法浅析

随着测试技术快速发展，机载设备ATS的复杂性和智能化不断提高，软硬件密切耦合，且测试软件的规模、复杂度及其在ATS的功能比重急剧上升，软件确认问题引起了美国军方的高度重视。首先介绍了国外机载设备ATS测试软件确认的背景，详细介绍了国外机载设备ATS测试软件确认的几种典型方法，包括软件的验证、配置管理、缺陷反馈和修改等方法，最后对我国机载设备ATS测试软件确认方法的研究和实施提出了建议。     

Using built-in-test to reduce TPS run times and improve TPSreliability

This paper addresses using information derived from Built-in-Test (BIT) to fault diagnose Units Under Test (UUTs), wherever possible. This philosophic approach to diagnostic testing is not new. It has been studied over the past 20 years under the visor of “Integrated Diagnostics”, but it has yet to be truly implemented in a “real life” military diagnostic test environment. The mindset of Test Program Set design engineering, along with customer and contractor management alike, remains “complete diagnostic testing based upon single catastrophic component failure modes”. If we are to generate cost efficient Test Program Sets (TPSs) under reduced military budget constraints, this will have to change! The test engineer must be encouraged to use methodologies to speed up development time and decrease TPS run times. Using present technology, this is possible now, and as the technology matures, will become a truly viable approach in the future. For the purpose of this paper, the author relies heavily on his extensive US Navy Automatic Test Equipment (ATE) and Test Program Set (TPS) experience, as well as on previous studies performed on using BIT to fault diagnose Unit Under Test failures on US Naval Air weapon systems     

机载计算机ATE计量校准软件的研究与设计

全面有效地计量校准军用ATE,对保证其正确性有效性非常重要.设计开发ATE计量校准程序,可以实现ATE自动化整体原位校准,提高计量保障效率和测试质量.介绍了机栽计算机ATE计量校准软件的系统结构,重点讨论了计量校准程序结构和面向信号的程序开发方法,最后描述了计量校准程序流程和实现方法.