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测控装备机内测试设备计量校准技术研究
引用本文:魏正华,叶小兰,孟洋,肖辽亮. 测控装备机内测试设备计量校准技术研究[J]. 宇航计测技术, 2020, 39(5): 27-31. DOI: 10.12060/j.issn.1000-7202.2019.05.06
作者姓名:魏正华  叶小兰  孟洋  肖辽亮
作者单位:航天系统部装备部装备保障队,北京 100094
摘    要:研究测控装备机内测试设备计量校准方法,获取机内测试设备技术状态的准确信息,是确保测控装备量值准确可靠的基础。以系统理论为指导,研究测控装备机内测试设备的工作运行机理和计量校准方法,选取某型测控装备,分析其技术要求、确定校准点、校准接口和校准设备,明确计量校准项目和参数,对提出的测控装备机内测试设备计量校准方法进行实验验证,为今后开展机内测试设备计量校准提供了方法和依据。

关 键 词:测控装备  机内测试设备  校准  

Design of (0.1~1.8)GHz SiGe HBT Ultra Broadband Low Noise Amplifier Circuit
WEI Zheng-hua,YE Xiao-lan,MENG Yang,XIAO Liao-liang. Design of (0.1~1.8)GHz SiGe HBT Ultra Broadband Low Noise Amplifier Circuit[J]. Journal of Astronautic Metrology and Measurement, 2020, 39(5): 27-31. DOI: 10.12060/j.issn.1000-7202.2019.05.06
Authors:WEI Zheng-hua  YE Xiao-lan  MENG Yang  XIAO Liao-liang
Affiliation:The Equipments Support Team of The Armaments Department of The Space System Departmnt,Beijing 100094,China
Abstract:In this paper,a small low-power ultra-wideband Low Noise Amplifier(LNA)that can work at(0.1~1.8)GHz was designed with chip of SiGe material.The LNA adopts the structure of two-stage amplifier and negative feedback method to achieve broadband matching.The resistor of small value was used to improve circuit stability.The size of LNA was 35mm×15mm.The measured results showed that when the LNA was working at room temperature,the operating frequency was(0.1~1.8)GHz,the gain reached 30dB,the noise figure was less than 0.82dB,the gain flatness was less than 0.5dB,the input and output return losses were less than -10dB,and the DC power consumption of the circuit was 41.8mW.When the LNA was working at the temperature of -40℃,the gain reached 32dB,the flatness of the gain and the input and output return losses were basically unchanged,and the noise figure was lower than 0.69dB.The feasibility of method proposed in the paper to calculate S parameters of SiGe amplifier at the temperature of -40℃ was verified.
Keywords:Ultra broad band   Low-power consumption   Low Noise Amplifier(LNA)   Temperature characteristic
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