| 基于VA32TA5电荷测量系统的设计和实现 |
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| 引用本文： | 任益文, 郭建华, 汪慎. 基于VA32TA5电荷测量系统的设计和实现[J]. 空间科学学报, 2016, 36(3): 395-400. doi: 10.11728/cjss2016.03.395 |
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| 作者姓名： | 任益文 郭建华 汪慎 |
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| 作者单位： | 1.中国科学院大学 北京 100049;;2.中国科学院紫金山天文台 南京 210008;;3.中国科学院暗物质与空间天文重点实验室 南京 210008 |
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| 基金项目： | 国家自然科学基金项目(11273070,11003051)和中国科学院青年创新促进会项目共同资助 |
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| 摘 要： | 半导体探测器具有分辨率好、灵敏度高、线性范围宽等优点,是空间X/$gamma$射线探测最常用的探测器.半导体探测系统对电子学系统的噪声水平和测量精度具有较严格的要求.针对半导体探测器对前端电子学的要求,构建了一个基于多通道电荷测量芯片VA32TA5的电荷测量系统,详细描述了该系统的设计原理和实现过程,并对其进行了初步测试.测试结果表明,该电荷测量系统具有噪声低和线性好的优点,适用于硅微条、碲锌镉等半导体探测器.
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| 关 键 词： | 半导体探测器 电荷测量 VA32TA5 系统测试 |
| 收稿时间： | 2015-04-23 |
| 修稿时间： | 2015-07-01 |
Design and Realization of Charge Measurement System Based on VA32TA5 |
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| REN Yiwen, GUO Jianhua, WANG Shen. Design and Realization of Charge Measurement System Based on VA32TA5[J]. Chinese Journal of Space Science, 2016, 36(3): 395-400. doi: 10.11728/cjss2016.03.395 |
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| Authors: | REN Yiwen GUO Jianhua WANG Shen |
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| Affiliation: | 1. University of Chinese Academy of Sciences, Beijing 100049;;2. Purple Mountain Observatory, Chinese Academy of Sciences, Nanjing 210008;;3. Key Laboratory of Dark Matter and Space Astronomy, Chinese Academy of Sciences, Nanjing 210008 |
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| Abstract: | Semiconductor detector has lots of advantages,such as good resolution,high sensitivity and wide linear range,which make it the most widely used detector in space exploration of X/γ Ray.Semiconductor detection system has strict requirements on its electronics system's noise level and measurement accuracy.Aiming at these requirements,a new charge measurement system based on the multi-channel charge measurement chip VA32TA5 is designed.This paper gives a detailed introduction of the system's design principle and implementation procedure,and also gives the preliminary results of performance at the end.Testing results indicate that the system has low noise and good linearity and therefore can be applied to semiconductor detectors,e.g.silicon strip detector,CdZnTe detector. |
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| Keywords: | Semiconductor detector charge measurement VA32TA5 System test |
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