| 基于CCD的单缝衍射条纹光强测量与小波去噪技术研究 |
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| 引用本文： | 钱光耀,赵光兴.基于CCD的单缝衍射条纹光强测量与小波去噪技术研究[J].宇航计测技术,2006,26(6):59-62. |
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| 作者姓名： | 钱光耀 赵光兴 |
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| 作者单位： | 钱光耀（安徽工业大学电气信息学院,安徽,马鞍山,243002）
赵光兴（安徽工业大学电气信息学院,安徽,马鞍山,243002） |
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| 摘 要： | 通过CCD的数据采集对单缝衍射条纹的光强进行测量试验,简要分析了试验中的噪声来源.提出使用小波技术对CCD的采集信号进行噪声滤除,详细讨论了小波的分解与重构以及在去除噪声中的应用.试验结果表明,小波技术能完全滤除噪声.
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| 关 键 词： | 数据采集 衍射条纹 光强 噪声源 小波去噪 |
| 文章编号： | 1000-7202(2006)06-0059-04 |
| 修稿时间： | 2006年7月19日 |
Application of the Light's Strength Measurement for Single Slot Diffraction Stripes Based on CCD Detection and Wavelet's Denoise Technology |
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| QIAN Guang-yao,ZHAO Guangxing.Application of the Light''''s Strength Measurement for Single Slot Diffraction Stripes Based on CCD Detection and Wavelet''''s Denoise Technology[J].Journal of Astronautic Metrology and Measurement,2006,26(6):59-62. |
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| Authors: | QIAN Guang-yao ZHAO Guangxing |
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| Abstract: | The light's intensity of single slot diffraction stripes is measured through the data acquisition of CCD detection,the source of noise in the experiment is briefly analyzed.The noise of CCD's data is filtered with the wavelet technology which is setout in this paper.The decomposing and composing of wavelet and the application of it in denoising are particularly discussed.The result of experiment(indicates) that the noise can be filtered completely by the wavelet. |
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| Keywords: | Data acquisition Diffraction stripes Intensity of light Noise source Wavelet denoise |
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