一种低成本UHF RFID芯片集中CP测试方法

随着电子产品日新月异的发展，在产品品质提高的同时，产品价格的下降也越来越被消费者重视。为了降低电子产品的价格，首先需要降低核心芯片的生产成本。UHF RFID芯片的设计成本很低，因此测试成本在芯片生产成本中占有很大比重。为此，提出了一种新颖的集中CP测试方案来降低芯片CP测试的成本。与最基本的8 芯片同测方案相比，不仅芯片面积变小，单组集中CP测试方案可对测试时间至少优化68%。如果单个测试单元的芯片个数改变，或者同时采用多组同测，还可以进一步降低测试成本，增强产品的市场竞争力。

A Low Cost Test Method for UHF RFID Centralized CP

With the rapid development of electronic products, improving the quality of the product, while decreasing product prices is also attended by consumers. Array of electronic products for a low price, the core chip production costs need to be reduced firstly. In passive UHF RFID （ Radio Frequency Identification） area, test cost is large percent of the total cost. Therefore a novel centralized CP test method is proposed. Compared with the current test method, which is testing parallel 8 chips every time, the test time of one group centralized CP test method can be optimized for more than 68%. If changing the number of chips existing in the single test group or adopting multi-groups centralized CP test, the test cost can be cut down substantially, and the market competitiveness of the chip products can be enhanced.