| 针对FPGA内缺陷成团的电路可靠性设计研究 |
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| 引用本文： | 杜文志,谭维炽.针对FPGA内缺陷成团的电路可靠性设计研究[J].中国空间科学技术,2004,24(2):19-26. |
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| 作者姓名： | 杜文志 谭维炽 |
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| 作者单位： | 北京空间飞行器总体设计部,北京,100086 |
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| 摘 要： | 文章分析了集成电路内缺陷成团机理及其对集成电路成品率的影响，应用集成电路成品率预计模型，分析了FPGA内缺陷成团对片内冗余容错电路可靠性的影响，据此提出了缺陷成团时提高FPGA片内冗余容错电路可靠性的策略，建立了相应的可靠性分析模型，给出了FPGA片内冗余容错电路布局的一些指导原则。
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| 关 键 词： | FPGA 缺陷成团 电路可靠性 设计 可靠性 冗余技术 微小卫星 现场可编程门阵列 |
Research on Design of Circuit Reliability in FPGA with Defect Clustering |
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| Du Wenzhi,Tan Weichi.Research on Design of Circuit Reliability in FPGA with Defect Clustering[J].Chinese Space Science and Technology,2004,24(2):19-26. |
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| Authors: | Du Wenzhi Tan Weichi |
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| Abstract: | Mechanism of defects clustering in IC and its influence on manufacturing yield of IC are analyzed in this paper. The influence of defects clustering in FPGA on the reliability of inside fault-tolerance circuit with redundancy is also discussed by using prediction model of manufacturing yield of IC. Hereby strategies of improving its reliability are presented, model for analyzing its reliability is set up and some guidance principles about how to lay are provided. |
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| Keywords: | Integrated circuit Reliability Redundancy technique Small satellite |
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