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等离子体鞘层效应对磁层探测电场仪设计的影响
引用本文:刘吉,周斌,李磊,冯永勇,张艺腾,叶建成.等离子体鞘层效应对磁层探测电场仪设计的影响[J].空间科学学报,2021,41(2):242-249.
作者姓名:刘吉  周斌  李磊  冯永勇  张艺腾  叶建成
作者单位:1 中国科学院国家空间科学中心, 空间天气学国家重点实验室 北京, 100190;
基金项目:国家重点研发计划项目;山东省光学天文与日地环境重点实验室基金项目共同资助
摘    要:在空间环境探测中,卫星与等离子体的相互作用会改变背景环境的粒子和电位的分布,从而影响探测器对空间电场的测量.为了给磁层卫星电场探测仪器的研制和设计提供参考,本文以中国未来的磁层电离层探测为背景,针对不同轨道高度的等离子体环境,利用SPIS(Spacecraft Plasma Interaction Software)模拟了卫星平台和探针与等离子体的相互作用,从而得到了不同环境下卫星周围等离子体鞘层的厚度,以及探针电位与电流的对应关系.模拟结果表明:由于光电子和二次电子的影响,卫星鞘层的厚度小于等离子体的德拜半径,且温度越高其偏差越大;模拟得到的探针表面电流与电位的关系表明,施加偏置电流的探针可明显提高对电流扰动的抗干扰能力.此外,估计了不同轨道高度上探针处于最佳工作点时应施加偏置电流的大小. 

关 键 词:电场仪    偏置电流    等离子体鞘层    数值模拟
收稿时间:2019-09-16

Effect of Plasma Sheath on the Design of Electric Field Instrument Detecting Magnetosheath
LIU Ji,ZHOU Bin,LI Lei,FENG Yongyong,ZHANG Yiteng,YIE Jiancheng.Effect of Plasma Sheath on the Design of Electric Field Instrument Detecting Magnetosheath[J].Chinese Journal of Space Science,2021,41(2):242-249.
Authors:LIU Ji  ZHOU Bin  LI Lei  FENG Yongyong  ZHANG Yiteng  YIE Jiancheng
Institution:1 State Key Laboratory of Space Weather, National Space Science Center, Chinese Academy of Sciences, Beijing 100190;2 University of Chinese Academy of Sciences, Beijing 100049;3 Joint Research and Development Center of Chinese Science Academy and Shen County, Liaocheng 252400
Abstract:The distribution of plasma potential and density around spacecraft is affected by the coupling of spacecraft and plasma, resulting in disturbing the detection of space electric field. In this paper, Spacecraft Plasma Interaction Software (SPIS for short) is used to provide a reference to design the electric field instrument detecting magnetosheath on future missions. The interaction of plasma with the spacecraft platform and the probe is simulated to investigate the thickness of plasma sheath and the relationship between current and voltage drop under different plasma conditions. Our results indicate that the thickness of plasma sheath covered spacecraft is smaller than the Debye radius, and this difference is larger at higher temperature conditions caused by photoelectrons and secondary electrons. Moreover, the current collected by the probe at a different voltage drop is also simulated. The simulated results show that the influence of current disturbance on measuring potential can be reduced by the probe with a bias current. Furthermore, the estimated optimum bias current is also listed corresponding to the detected region. 
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